首页 | 本学科首页   官方微博 | 高级检索  
     


Principles of Built-In-Test for Run-Time-Testability in Component-Based Software Systems
Authors:Vincent  Jonathan  King  Graham  Lay  Peter  Kinghorn  John
Affiliation:(1) Southampton Institute, East Park Terrace, Southampton, Hampshire, SO14 OYN, U.K.;(2) Philips Semiconductors, Millbrook Ind. Est., Southampton, Hampshire, SO15 ODJ, U.K.
Abstract:This paper examines the motivations and expectations of Built-In-Test (BIT) techniques for Run-Time-Testability (RTT) in component-based software systems. The difficulties associated with testing and integrating fully encapsulated components lead to a requirement for testing interfaces. The format of these interfaces is explored at a high level of abstraction, and some possibilities for Built-In-Test (BIT) are described. BIT is concerned with the detection of error conditions arising internally to a component, or arising from erroneous component interactions, and the propagation of these error conditions to a system component having responsibility for error handling and/or recovery. The implications for testability, reliability and maintainability are discussed, and it is concluded that BIT offers potential for improved product quality. Whilst the proposed approach is considered appropriate for a wide range of software systems, issues related to real-time systems, such as deadlock and timing constraints are of particular interest.
Keywords:component based software engineering  built-in-test  verification and validation  continuous test
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号