Principles of Built-In-Test for Run-Time-Testability in Component-Based Software Systems |
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Authors: | Vincent Jonathan King Graham Lay Peter Kinghorn John |
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Affiliation: | (1) Southampton Institute, East Park Terrace, Southampton, Hampshire, SO14 OYN, U.K.;(2) Philips Semiconductors, Millbrook Ind. Est., Southampton, Hampshire, SO15 ODJ, U.K. |
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Abstract: | This paper examines the motivations and expectations of Built-In-Test (BIT) techniques for Run-Time-Testability (RTT) in component-based software systems. The difficulties associated with testing and integrating fully encapsulated components lead to a requirement for testing interfaces. The format of these interfaces is explored at a high level of abstraction, and some possibilities for Built-In-Test (BIT) are described. BIT is concerned with the detection of error conditions arising internally to a component, or arising from erroneous component interactions, and the propagation of these error conditions to a system component having responsibility for error handling and/or recovery. The implications for testability, reliability and maintainability are discussed, and it is concluded that BIT offers potential for improved product quality. Whilst the proposed approach is considered appropriate for a wide range of software systems, issues related to real-time systems, such as deadlock and timing constraints are of particular interest. |
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Keywords: | component based software engineering built-in-test verification and validation continuous test |
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