| NAND FLASH在储存测试系统中的应用 |
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| 引用本文： | 王文杰,马游春,李锦明. NAND FLASH在储存测试系统中的应用[J]. 电子技术, 2009, 0(4): 4-5 |
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| 作者姓名： | 王文杰 马游春 李锦明 |
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| 作者单位： | 中北大学,电子测试技术国家重点实验室 |
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| 摘 要： | 主要介绍了三星公司的NAND FLASH存储器K9K8G08UOM、以FPGA为核心模块控制K9K8G08UOM的读操作、写操作和擦除操作,以及FLASH储存器在硬件设计中的具体接法。经实际电路测量验证了其功能的正确性。
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| 关 键 词： | NAND FLASH K9K8G08UOM FPGA 读操作 |
High density NAND Flash Used in Storage and Test systems |
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| Wang WenJie,Ma Youchun,Li Jingming. High density NAND Flash Used in Storage and Test systems[J]. Electronic Technology, 2009, 0(4): 4-5 |
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| Authors: | Wang WenJie Ma Youchun Li Jingming |
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| Affiliation: | Key Lab of Instrumentation Science & Dynamic Measurement;North University of China;Ministry of Education |
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| Abstract: | The paper mostly present NAND FLASH memory K9K8GOSUOM of Samsung corporation, controlling K9K8GO8UOM＇ read operation, write operation and erase operation with FPGA, and the concrete connect method of FLASH memory in the hardware design. By practical circuit testing , prove the correctness of the functions. |
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| Keywords: | NAND FLASH K9K8G08U0M FPGA |
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