Trap-free,space-charge-limited currents in a polyfluorene copolymer using pretreated indium tin oxide as a hole injecting contact |
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| Affiliation: | 1. Department of Medical Genetics, School of Medicine, Keimyung University, Daegu 42601, Republic of Korea;2. Medical Laboratory Technology Department, College of Applied Medical Sciences, Jazan University, Jazan 45142, Saudi Arabia;3. Research and Scientific Studies Unit, College of Nursing and Allied Health Sciences, Jazan University, Jazan 45142, Saudi Arabia;4. Department of Pathology, Dongsan Medical Center, School of Medicine, Keimyung University, Daegu 42601, Republic of Korea;5. Department of Anatomy, Keimyung University School of Medicine,1095 Dalgubeol-daero, Dalseo-gu, Daegu 42601, Republic of Korea;6. Department of Laboratory Medicine, Daegu Catholic University School of Medicine, Daegu, Republic of Korea;7. Hanvit Institute for Medical Genetics, Daegu, Republic of Korea |
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| Abstract: | We report time-of-flight, transient dark injection (DI) and current density versus voltage measurements on polyfluorene copolymer diode structures using pretreated indium tin oxide (ITO) as a hole injecting contact. For ITO exposed to an oxygen plasma, coated in poly(ethylenedioxythiophene)/polystyrenesulphonic acid, or with both treatments, all measurements were entirely consistent with positive carrier, trap-free, space-charge-limited current theory. For untreated ITO, the behaviour is instead injection limited. |
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