基于单片机的温度存储测试技术研究

爆炸温度场具有温度高、面积大、变化快的特点,伴有高压及高速气流,常规的有线式温度测试方法存在测试电缆易损坏、误触发等问题。基于此,设计了一种爆炸温度场存储式测温系统。该系统由上位机及下位机系统组成,下位机系统主要由钨铼热电偶、信号调理模块、C8051F020单片机、存储模块、通讯接口等硬件组成,并利用C语言设计了测试系统的下位机程序,采用LABVIEW编制了上位机处理软件。分别从方案设计、硬件实现、软件实现等方面进行了研究和描述,并给出了测试系统的典型应用。实验结果表明,该系统稳定可靠,能够准确有效地进行温度信号采集,并获取相应的实验参数。

Research of explosion temperature storage testing technology based on MCU

Explosion temperature field is usually of high temperature,large area,fast changing,accompanied by high pressure and high-speed airflow,conventional wired temperature test method used had problems of easily to damage,false triggering and other issues.Based on this,this paper designed a blast temperature storage-type temperature measuring system.The system consists of host computer and the next-bit computer system component,the next-bit machine system is mainly composed of tungsten rhenium thermocouple,signal conditioning modules,C8051F020 microcontroller,memory modules,communication interfaces and hardware components,and the use of C language designed to program the next-bit machine system.using LABVIEW to produce a host computer processing software.In this paper,from program design,hardware implementation,software implementation,synchronous triggering,dynamic compensation carried out a detailed study and description,and gives typical application of the test system.The experimental results show that the system is stable and reliable,able to accurately and effectively conduct the temperature signal acquisition,and obtain the corresponding experimental parameters.