Testability-analysis driven test-generation of analogue cores |
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| Authors: | M Stan?i? HG Kerkhoff |
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| Affiliation: | MESA+ Research Institute/University of Twente, Testable Design and Testing of Microsystems Group, P.O. Box 217, 7500 AE Enschede, The Netherlands |
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| Abstract: | A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach. |
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| Keywords: | Testability Controllability Observability |
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