| 微波单片集成电路的成品率优化 |
| |
| 引用本文： | 吴洪江,薛勇健. 微波单片集成电路的成品率优化[J]. 微纳电子技术, 1996, 0(2) |
| |
| 作者姓名： | 吴洪江 薛勇健 |
| |
| 作者单位： | 电子部第１３研究所 |
| |
| 摘 要： | 采用建立管芯等效电路模型、灵敏度分析以及统计勘探法对微波单片集成电路进行成品率优化，并编制了软件，加入到ＧａＡｓＩＣＣＡＤ系统中。应用该软件对Ｘ波段低噪声ＭＭＩＣ、超宽带ＭＭＩＣ放大器进行了设计，成品率有较大的提高，电路性能有所改善。
|
| 关 键 词： | 微波单片集成电路，灵敏度分析，统计勘探法，成品率优化 |
Yield Optimization of MMIC |
| |
| Wu Hongjiang,Xue Yongjian. Yield Optimization of MMIC[J]. Micronanoelectronic Technology, 1996, 0(2) |
| |
| Authors: | Wu Hongjiang Xue Yongjian |
| |
| Abstract: | This paper describes a program which uses chip equivalent circuits,sensitivity analysis and statistical exploration approach to improve the yield of MMIC. Some low noise MMIC amplifiers of X band, ultrabroad band have been designed using the program. The yields and the properties of the MMICs have been improved respectively. |
| |
| Keywords: | MMIC Sensitivity analysis Satistical exploration approach Yield Optimization |
| 本文献已被 CNKI 等数据库收录！ |
