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Capacitively coupled transmission line pulsing cc-TLP––a traceable and reproducible stress method in the CDM-domain |
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| Authors: | Heinrich Wolf Horst Gieser Wolfgang Stadler Wolfgang Wilkening |
| Affiliation: | a Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (IZM-M/ATIS Analysis and Test of Integrated Systems), Hansastrasse 27d, D-80686, München, Germany;b Infineon Technologies AG, P.O. Box 800949, D-81609, Munich, Germany;c Robert Bosch GmbH, Postfach 1342, D-72703, Reutlingen, Germany |
| Abstract: | This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The cc-TLP results correlate well with the CDM data. |
| Keywords: | ESD CDM cc-TLP vf-TLP Package emulator Protection element Gate monitor |
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