Catalyst incorporation at defects during nanowire growth |
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Authors: | Hemesath Eric R Schreiber Daniel K Gulsoy Emine B Kisielowski Christian F Petford-Long Amanda K Voorhees Peter W Lauhon Lincoln J |
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Affiliation: | Department of Materials Science and Engineering, Northwestern University, 1881 Sheridan Road, Evanston, Illinois 60208, USA. |
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Abstract: | Scanning and transmission electron microscopy was used to correlate the structure of planar defects with the prevalence of Au catalyst atom incorporation in Si nanowires. Site-specific high-resolution imaging along orthogonal zone axes, enabled by advances in focused ion beam cross sectioning, reveals substantial incorporation of catalyst atoms at grain boundaries in <110> oriented nanowires. In contrast, (111) stacking faults that generate new polytypes in <112> oriented nanowires do not show preferential catalyst incorporation. Tomographic reconstruction of the catalyst-nanowire interface is used to suggest criteria for the stability of planar defects that trap impurity atoms in catalyst-mediated nanowires. |
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