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IGBT模块寿命预测模型综述
引用本文:方鑫,周雒维,姚丹,杜雄,孙鹏菊,吴军科.IGBT模块寿命预测模型综述[J].电源学报,2014,12(3):14-21.
作者姓名:方鑫  周雒维  姚丹  杜雄  孙鹏菊  吴军科
作者单位:重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室
基金项目:国家自然科学基金重点项目(51137006)
摘    要:在风力发电、柔性交流输电以及电机牵引和航空中等应用的变流器系统失效中,IGBT的失效所占比重较大。因此,相继提出了一些IGBT寿命预测的模型以研究其可靠性。为给系统可靠性设计者以及终端用户提供更多变流器中IGBT模块的寿命信息,文中综述了IGBT寿命预测模型的发展与研究现状。根据建模方法的不同,寿命模型可分为解析模型和物理模型两大类。文中对不同模型的建模依据分别做出了说明,在分析IGBT常见失效机理的基础上,对比分析了各模型在实际应用中的精确度、通用性与局限性。同时,介绍了加速老化试验对寿命预测模型的影响。最后,讨论了IGBT模块寿命预测模型的挑战与发展趋势。

关 键 词:IGBT  可靠性  失效机理  寿命预测模型  加速老化试验
收稿时间:1/4/2014 12:00:00 AM
修稿时间:2014/2/27 0:00:00

An Overview of IGBT Life Prediction Models
FANG Xin,ZHOU Luo-wei,YAO Dan,DU Xiong,SUN Peng-ju and WU Jun-ke.An Overview of IGBT Life Prediction Models[J].Journal of power supply,2014,12(3):14-21.
Authors:FANG Xin  ZHOU Luo-wei  YAO Dan  DU Xiong  SUN Peng-ju and WU Jun-ke
Affiliation:State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University
Abstract:In applications such as wind-power generation, FACTS, electrical motor traction and aviation, the failures of IGBTs contribute a large part of those of the converters'. Therefore, a number IGBT life prediction models was proposed to study the reliability problems of power converters. To provide more life information about IGBTs in converters for both system reliability designers and terminal users, this paper presented an overview of the development and research status of IGBT life prediction models. Based on different modeling methods, these models can be categorized into analytical models and physical ones. In this paper, the modeling basis of different models were stated respectively. Based on the analysis of common failure mechanisms of IGBT, these models were compared in term of accuracy and popularity. And the paper also illustrated the impact of accelerated aging tests on life prediction models. Finally, the challenges and development trend of IGBT life prediction models were briefly discussed.
Keywords:IGBT  reliability  failure mechanism  life prediction model  accelerated aging tests
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