Sn和冷轧板厚度对取向硅钢初次再结晶组织和织构影响

研究了Sn含量和冷轧板厚度对取向硅钢冷轧板脱碳渗氮退火后组织和织构的影响,发现随着厚度减小和Sn含量增加,初次再结晶晶粒尺寸趋于减小,增加Sn含量导致对Goss取向形成的不利织构{001}〈120〉增加,而钢板厚度减薄时{111}〈112〉、{411}〈148〉等有利织构和{001}〈120〉不利织构均增加。Sn在氧化层中的含量显著小于基体,在氧化层/基体的界面处有显著的浓度梯度。虽普遍认为Sn的晶界偏聚是影响退火组织和织构的原因,但俄歇电子能谱只能偶然检测到,推测或是该偏聚不具有普遍性,或是其偏聚厚度极小超出了仪器检测的范围。

Effect of Sn and sheet thickness on primary recrystallized microstructure and texture in cold-rolled grain-oriented silicon steel

Effects of both Sn content and the steel sheet thickness on the primary recrystallized microstructure and texture in the cold-rolled grain-oriented silicon steel after decarburization and nitriding annealing were investigated. The result showed that the decreasing thickness and the increasing Sn content both led to the decrease of primary recrystallized grain size. Moreover, the higher Sn content produced stronger texture component, {001}〈120〉, which was unfavorable for the formation of Goss grains; while not only this unfavorable texture component but also the favorable texture component ({111}〈112〉 and {411}〈148〉) were both enhanced at the smaller thickness. The Sn content in the oxide layer was significantly lower than that in steel matrix, leading to a significant Sn concentration gradient developed across the interface of the oxide layer/matrix. Although it is generally believed that the Sn segregation at grain boundaries should strongly influence the primary recrystallization, the extensive examination by Auger electron spectroscopy indicated that it could be detected just incidentally in some grain boundaries and most of boundaries were free of Sn segregation. Therefore, it was inferred that either the Sn segregation at boundaries was not universal, or the thickness of segregation layer was too narrow to be detected due to the limit of employed technique.