光器件金线图像高光区域的检测与去除

针对视觉检测过程中光器件金线表面出现的高光现象，提出一种光器件金线图像高光区域的检测与去除方法。首先，根据采集的金线图像进行特征分析，利用OTSU算法分割高光区域；其次，调用MATLAB中的bwareaopen()函数删除小面积对象，即高光闭合区域，并通过图像的差值运算提取高光区域图像；最后，采用八邻域像素平均值的方法更新高光区域像素值，该方法既可以去除高光区域，又可以保证此区域像素值在图像中的均衡分布。通过仿真实验结果分析，验证了金线图像高光区域检测与去除方法的有效性和可行性，同时为后续金线的质量检测提供有力保障。

Detection and removal of highlight area in metal wire image of optical device

In this paper, aiming at the highlight phenomenon on the surface of optical device metal wire in the process of visual detection, a method for detecting and removing the highlight area of optical device metal wire image is proposed. First, according to the feature analysis of the collected metal wire image, the highlight area is segmented by the OTSU algorithm. Then, the bwareaopen function in MATLAB is called to delete small-area objects, that is, the highlight closed area, and the highlight area image is extracted through the image difference operation. Finally, the pixel value of the highlight area is updated by the method of the average value of the eight-neighborhood pixels. This method not only removes the highlight area, but also ensures the balanced distribution of the pixel value of this area in the image. Through the analysis of simulation experiment results, the effectiveness and feasibility of the method for detecting and removing the highlights of the metal wire image are verified. Meanwhile, it provides a strong guarantee for the subsequent quality inspection of the metal wire.