首页 | 本学科首页   官方微博 | 高级检索  
     

基于网格搜索的改进SVM模拟电路故障诊断方法
引用本文:潘曙光,刘香,唐圣学,董庆远,李亮.基于网格搜索的改进SVM模拟电路故障诊断方法[J].微电子学,2018,48(1):108-114.
作者姓名:潘曙光  刘香  唐圣学  董庆远  李亮
作者单位:河北工业大学 电磁场与电器可靠性省部共建重点实验室, 天津 300130,河北工业大学 电磁场与电器可靠性省部共建重点实验室, 天津 300130,河北工业大学 电磁场与电器可靠性省部共建重点实验室, 天津 300130,河北工业大学 电磁场与电器可靠性省部共建重点实验室, 天津 300130,河北工业大学 电磁场与电器可靠性省部共建重点实验室, 天津 300130
基金项目:国家自然科学基金资助项目(51477040);河北省自然基金资助项目(E2015202263)
摘    要:针对模拟电路故障识别与诊断问题,提出了一种基于K最近邻的一对一SVM分类器(KNN-OSVM)的故障诊断方法。将K最近邻算法与用网格搜索法优化后的一对一SVM模型相结合,建立KNN-OSVM模型,有效解决了SVM因存在不可分域造成的误分问题,提高了故障诊断率。采用小波分析法提取输出端电压信号作为故障特征值,采用网格搜索对核函数、惩罚参数寻优。采用两个模拟电路进行仿真实验,并将改进的SVM与传统SVM进行对比。结果证明了该故障诊断方法的可行性。

关 键 词:模拟电路    故障诊断    支持向量机    K最近邻    网格搜索
收稿时间:2017/4/6 0:00:00

An Improved SVM Analog Circuit Fault Diagnosis Method Based on Grid Search
PAN Shuguang,LIU Xiang,TANG Shengxue,DONG Qingyuan and LI Liang.An Improved SVM Analog Circuit Fault Diagnosis Method Based on Grid Search[J].Microelectronics,2018,48(1):108-114.
Authors:PAN Shuguang  LIU Xiang  TANG Shengxue  DONG Qingyuan and LI Liang
Affiliation:Province-Ministry Joint Key Lab. of Electromag. Field and Elec. Apparatus Reliab., Hebei Univ. of Technol., Tianjin 300130, P. R. China,Province-Ministry Joint Key Lab. of Electromag. Field and Elec. Apparatus Reliab., Hebei Univ. of Technol., Tianjin 300130, P. R. China,Province-Ministry Joint Key Lab. of Electromag. Field and Elec. Apparatus Reliab., Hebei Univ. of Technol., Tianjin 300130, P. R. China,Province-Ministry Joint Key Lab. of Electromag. Field and Elec. Apparatus Reliab., Hebei Univ. of Technol., Tianjin 300130, P. R. China and Province-Ministry Joint Key Lab. of Electromag. Field and Elec. Apparatus Reliab., Hebei Univ. of Technol., Tianjin 300130, P. R. China
Abstract:Aiming at the fault identification and diagnosis problems of analog circuit, a fault diagnosis method based on K nearest neighbor and one against one support vector machine (KNN-OSVM) classifier was proposed. The KNN-OSVM model was established by combining the K nearest neighbor algorithm with the one against one SVM model optimized by the grid search method, which could effectively solve the problem of misclassification caused by the non-separable support vector machine and improve the fault diagnosis rate. The wavelet transform method was used to extract the fault features from the output voltage signals, and the grid search method was adopted to optimize the kernel functions and penalty parameters. The simulation experiments were carried out by two analog circuits. The improved SVM was compared with the traditional SVM. The simulation results showed the feasibility of the algorithm.
Keywords:analog circuit  fault diagnosis  support vector machine  K nearest neighbor  grid search
点击此处可从《微电子学》浏览原始摘要信息
点击此处可从《微电子学》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号