| 门级电路可靠性评估方法比较 |
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| 引用本文： | 王真. 门级电路可靠性评估方法比较[J]. 上海电力学院学报, 2014, 30(2): 155-160 |
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| 作者姓名： | 王真 |
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| 作者单位： | 上海电力学院计算机科学与技术学院,上海200090 |
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| 摘 要： | 针对软差错影响下的电路可靠性问题,选取了TP算法、EPP方法和PTM方法 3种门级电路可靠性评估方法,分别介绍其原理,并结合实验指出了它们的功能、适用范围以及复杂度.
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| 关 键 词： | 电路可靠性 软差错 门级 信号概率 |
| 收稿时间： | 2013-09-13 |
Comparison of Gate-level Circuit Reliability Estimation Methods |
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| WANG Zhen. Comparison of Gate-level Circuit Reliability Estimation Methods[J]. Journal of Shanghai University of Electric Power, 2014, 30(2): 155-160 |
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| Authors: | WANG Zhen |
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| Affiliation: | WANG Zhen ( School of Computer Science and Technology, Shanghai University of Electric Power, Shanghai 200090, China) |
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| Abstract: | To investigate the circuit reliability under the effect of soft errors, such three gatelevel circuit reliability estimation methods as TP algorithm, EPP method and PTM method are analyzed, whose function, complexity and extent of application are compared on experiments. |
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| Keywords: | circuit reliability soft error gate-level signal probability |
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