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8098芯片在低频测控系统中的出错分析
引用本文:陈启圣. 8098芯片在低频测控系统中的出错分析[J]. 湖北工业大学学报, 2006, 21(5): 40-41
作者姓名:陈启圣
作者单位:江汉大学物理与信息工程学院,湖北,武汉,430056
摘    要:分析了应用8098芯片高速输入HIS进行低频测控时的出错原因,并提出了解决问题的相应措施.

关 键 词:8098芯片  HIS  低频测控
文章编号:1003-4684(2006)10-0040-02
收稿时间:2005-11-07
修稿时间:2005-11-07

Analysis of Mistake Causation in the Measure System of Low Frequency by Application of 8098 Chip and Solution to the Problem
CHEN Qi-sheng. Analysis of Mistake Causation in the Measure System of Low Frequency by Application of 8098 Chip and Solution to the Problem[J]. Journal of Hubei University of Technology, 2006, 21(5): 40-41
Authors:CHEN Qi-sheng
Abstract:This paper concerns the analysis of mistake causation when inputting HIS at high speed to measure low frequency by application of 8098 chip and suggests the solution to the problem.
Keywords:8098chip  measure of low frequency  
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