| Abstract: | Copper forms passivating layers in alkaline solutions. Depending on the electrode potential a Cu2O or a Cu2O/CuO, Cu(OH)2 layer is present. The structure and composition of the film has been examined by different methods like X-ray Photoelectron Spectroscopy (XPS), Ion Scattering Spectroscopy (ISS) and in situ Photoacoustic Spectroscopy (PAS). The thickness and growth of the passive layer has been determined by its electrochemical reduction i. e. the charges of potentiodynamic reduction peaks or the evaluation of the corresponding galvanostatic steps. The results support a high field mechanism for the oxide formation with an inverse logarithmic rate law and a linear increase of the oxide thickness with the electrode potential. The capacity of a Cu2O-layer refers to the characteristics of a thin semiconducting film. Studies with a rotating Pt split ring Cu disc electrode permit the subdivision of the current density into a part of layer formation and corrosion. The efficiency for the corrosion part is very small during the beginning of oxide formation and achieves ν = 90% after some few minutes. In the potential range of Cu2O formation only ν = 50% is achieved. |
