| 亚波长结构的抗反射特性三维TLM方法模拟 |
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| 引用本文： | 刘汉玉,王庆康. 亚波长结构的抗反射特性三维TLM方法模拟[J]. 光电子技术, 2008, 28(1): 50-54 |
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| 作者姓名： | 刘汉玉 王庆康 |
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| 作者单位： | 上海交通大学,微纳科学技术研究院,薄膜与微细技术教育部重点实验室微米/纳米加工技术国家级重点实验室,上海,200030;上海交通大学,微纳科学技术研究院,薄膜与微细技术教育部重点实验室微米/纳米加工技术国家级重点实验室,上海,200030 |
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| 摘 要： | 传输线矩阵(Transmission line matrix,以下简称TLM)方法,根据场方程和传输线方程之间的相似性,用等效分布传输线网络模拟给定结构,在时间和空间上进行离散化,是一种强有力的三维时域电磁场数值仿真算法.简要介绍三维扩展型结点TLM方法的模型、激励源和边界条件,并使用该方法对亚波长结构的抗反射特性进行模拟研究,为进一步深入探讨该结构的抗反射特性、进行优化设计提供依据.
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| 关 键 词： | 亚波长结构 传输线矩阵方法 抗反射 |
| 文章编号： | 1005-488X(2008)01-0050-05 |
| 修稿时间： | 2007-07-02 |
3D TLM Method Simulation for Antireflection Characteristics of Subwavelength Structures |
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| LIU Han-yu,WANG Qing-kang. 3D TLM Method Simulation for Antireflection Characteristics of Subwavelength Structures[J]. Optoelectronic Technology, 2008, 28(1): 50-54 |
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| Authors: | LIU Han-yu WANG Qing-kang |
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| Affiliation: | LIU Han-yu,WANG Qing-kang (Research Institute of Micro/Nano Science , Technology,Shanghai Jiao Tong Univ.,Key Laboratory for Thin Film , Micro fabrication Technology of Ministry of Education,National Key Laboratory of Micro/Nano Fabrication Technology,Shanghai 200030,CHN) |
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| Abstract: | Transmission line matrix method,modeling structures by equivalent TLM network in discrete time and discrete space based on the equivalence of field and TLM equations,becomes an invaluable 3D time-domain numerical method for the microwave simulations.After the model,input and boundaries of the 3D TLM method are reviewed,this method is implied to simulate the antireflection characteristics of subwavelength structures.It offers the fundamental for further researches and optimizing design of antireflection subw... |
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| Keywords: | subwavelength structures transmission line matrix method TLM method antireflection |
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