A study on the secondary electron emission from Na-ion-doped MgO films in relation to the discharge characteristics of plasma display panels |
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Authors: | Sung Il Ahn Seong Eui Lee Kyung Cheol Choi Heiju Uchiike |
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Affiliation: | a Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, 373-1 Guseong-Dong, Yuseong-Gu, Daejeon 305-701, Republic of Korea b Department of Advanced Materials Engineering, Korea Polytechnic University, 2121 Jeongwang-Dong, Shihung-Si, Gyeonggi-Do 429-793, Republic of Korea c Department of Information Display, Kyung Hee University, Hoegi-Dong, Dongdaemun-Gu, Seoul 130-701, Republic of Korea |
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Abstract: | Using a sol-gel precursor, Na-ion-doped MgO was prepared and applied to alternative current plasma display panels (ac-PDP). The cathodoluminescence spectra showed that the F+ center was increased as the concentration of Na+ was increased. Numerous pores were found on the printed MgO surface and seemed to give higher memory margin of ac-PDP compared to an electron beam-evaporated MgO film. All doped MgO showed higher secondary electron emission than printed pure MgO, likely owing to the O defect states of MgO. In addition, this result indicated the operational memory margin of the ac-PDP was directly proportional to the grade of surface charging. |
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Keywords: | ac-PDP MgO Na-ion-doping Secondary electron emission Porous film Cathodoluminescence X-ray diffraction Scanning electron microscopy |
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