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Channel-hot-carrier degradation in the channel of junctionless transistors: a device- and circuit-level perspective |
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| Authors: | Panchore Meena Bramhane Lokesh Singh Jawar |
| Affiliation: | 1.Department of Electronics and Communication Engineering, National Institute of Technology, Patna, 800005, India ;2.Department of Electronics and Telecommunication Engineering, G H Raisoni College of Engineering, Nagpur, 440016, India ;3.Department of Electrical Engineering, Indian Institute Technology, Patna, 801106, India ; |
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