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激光能量对掺铒纳米Si晶薄膜形貌的影响
引用本文:何雷,王文军,周阳,邓泽超. 激光能量对掺铒纳米Si晶薄膜形貌的影响[J]. 华北电力大学学报(自然科学版), 2006, 33(3): 110-112
作者姓名:何雷  王文军  周阳  邓泽超
作者单位:河北大学,物理科学与技术学院,河北,保定,071002;保定师范专科学校,物理系,河北,保定,071000;保定师范专科学校,物理系,河北,保定,071000;河北大学,物理科学与技术学院,河北,保定,071002
摘    要:采用XeCl脉冲准分子激光器,保持激光脉冲比为1:2,分时烧蚀Er靶和高阻抗单晶Si靶。改变激光能量,在真空中沉积了掺Er非晶Si薄膜。在氮气保护下,分别在950℃,1010℃和1100℃温度下进行30min热退火处理,得到掺Er纳米晶Si薄膜。扫描电子显微镜的结果表明,高的退火温度或高的激光能量均会导致迷津结构的形成。

关 键 词:掺Er纳米Si晶粒  脉冲激光烧蚀沉积  形貌
文章编号:1007-2691(2006)03-0110-03
修稿时间:2005-12-22

Influence of laser energy on morphology of nanocrystalline silicon films prepared by laser ablation
HE Lei,WANG Wen-jun,ZHOU Yang,DENG Ze-chao. Influence of laser energy on morphology of nanocrystalline silicon films prepared by laser ablation[J]. Journal of North China Electric Power University, 2006, 33(3): 110-112
Authors:HE Lei  WANG Wen-jun  ZHOU Yang  DENG Ze-chao
Abstract:In the experimental situation,the Er and Si targets are ablated alternately with the pulse-number-ratio of 1: 2 by a XeCl excimer laser.The Er-doped amorphous Si films are prepared in vacuum by different laser energy.The as-formed films,being annealed for 30 minutes at the constant temperature of 950℃,1010℃or 1100℃in N2 gas,are converted into Er-doped nanocrystalline Si films.The scanning images of electron microscopy show that high annealing temperature or high laser energy can induce the nanocrystalline Si film with mazes.
Keywords:Er-doped nanocrystalline Si film  pulsed laser ablation  morphology
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