| 大功率白光LED寿命试验及失效分析 |
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| 引用本文： | 赵阿玲,尚守锦,陈建新. 大功率白光LED寿命试验及失效分析[J]. 照明工程学报, 2010, 21(1): 48-52,57 |
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| 作者姓名： | 赵阿玲 尚守锦 陈建新 |
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| 作者单位： | 北京工业大学,电子信息与控制学院,北京,100022 |
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| 摘 要： | 为了进行大功率白光LED可靠性研究,对大功率白光LED进行电流应力加速寿命试验,分析研究光通量、发光效率、峰值波长、主波长和电压等参数随老化时间的变化情况,通过对试验出现的结果和失效现象进行分析比较,表明衰变退化的主要原因是荧光粉的退化、封装材料的热退化,以及散热问题导致的退化等。
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| 关 键 词： | 白光LED 老化 失效 |
Life Test and Failure Mechanism Analyses for High-power White LED |
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| Zhao Aling Shang Shoujin Chen Jianxin. Life Test and Failure Mechanism Analyses for High-power White LED[J]. China Illuminating Engineering Journal, 2010, 21(1): 48-52,57 |
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| Authors: | Zhao Aling Shang Shoujin Chen Jianxin |
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| Affiliation: | Zhao Aling Shang Shoujin Chen Jianxin(School of electronic information , control engineering,Beijing University of Technology,Beijing 100022) |
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| Abstract: | In this paper,current stress accelerated lifetime tests and reliability test are introduced for white LED formed by high-power GaN blue chips and phosphor.Some performance parameters such as lumen flux,luminous efficacy,peak wavelength,the main wavelength and voltage were studied.According to experimental results,the main reasons of slow failure are the blue chip performance degradation and decay phosphor.Some methods to improve the reliability were indicated in paper. |
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| Keywords: | White LED Aging failure |
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