Ne同位素分离中微量杂质的气相色谱法

用气相色谱法测定热扩散法生产的Ne同位素气体的化学纯度。Ne同位素产品中的杂质主要为O2和N2(≤0.1%)及极微量的CO2、CH4、Ar、He、H2。Ne同位素产品分析过程借助控制待测气体中关键组分O2、N2的方法可以间接表征Ne同位素气体的化学纯度。实验采用H2气为载气、分子筛为固定相、柱温40.5°C,O2、N2检测灵敏度分别为0.0113%/mm、0.0331%/mm。进样方式为活动定体积进样,样品量≤2mL,平均偏差分别为0.01%、0.03%。

Analysis of Trace Impurities in the Separation of Ne Isotope by Gas Chromotography

The purity of the Ne isotopic gas produced by was determined with thermal diffusion gas chromotography. The major impurities in the isotopic products are O_2 and N_2(≤0.1%), which are tested and used to signify indirectly the purity of Ne isotopic gas. In the test, H_2 is used as the carrier, molecular sieve as the immobile phase, and the temperature is controlled at (40.5°C). The analysis sensitivity of O_2 and N_2 are 0.0113%/mm and 0.0331%/mm, respectively. The feeding volume is ≤2 mL, and the average errors for O_2 and N_2 are 0.01% and 0.03%, respectively.