GIS设备异物缺陷X射线检测研究

SF6气体绝缘全封闭组合电器(GIS)内部可能出现金属微粒等异物缺陷导致故障,因此对GIS设备内部的异物缺陷故障进行检测具有重要的意义。X射线成像法是一种检测GIS设备内部缺陷的有效方法,但缺乏成熟的参数选择方法。文中对X射线检测的基本理论进行了介绍,对GIS设备X射线检测参数选择方法进行了讨论,并为220kV GIS设备内异物缺陷检测选择了合适的参数。在选定参数下,使用双丝像质计对射线成像系统的不清晰度进行了研究,验证了X射线对金属微粒缺陷检测的可行性,之后在GIS设备内部设置异物缺陷并利用X射线检测系统进行缺陷检测。结果表明,选定参数能够对遗落零件缺陷以及1～2 mm的铜金属微粒缺陷进行有效的检测;对1～2 mm的铝金属微粒缺陷,X射线成像法能够实现检测,但对比度较低。

X-Ray Detection for Foreign Body Defect in GIS

Foreign body defect such as metallic particles inside gas insulated switchgear(GIS)can cause insulation fault,so it is of great significance to detect this kind of defect.X-ray detection is an effective method to detect inner defects in GIS,but this method is lacking in mature method of selecting parameters.In this paper,basic theory of X-ray detection is introduced,and method of selecting parameters for X-ray detection is discussed.Then proper parameters for detecting foreign body defect for 220kV GIS is selected.Under selected parameters,unsharpness of radiographic imaging system is studied by using duplex wire image quality indicator,which verifies the feasibility of X-ray detection for metallic particle defects.Then,foreign body defect in GIS is detected and studied.The results show that defect of missing parts and copper particles defect of a diameter of 1-2mm can be effectively detected by computed radiography system.Aluminum particles defect of 1-2mm can be detected,but with low contrast.