| Abstract: | Abstract— The reduction of a structural pattern at specific gray levels caused by digital halftone methods is the subject of this paper. This problem is more severe in some flat‐panel displays because their black levels typically are brighter than other display blocks. A patented halftone algorithm, confined error diffusion (CED), that confines the error‐carry within the dither mask is described and extended. First, the CED algorithm that dynamically applies random error diffusion or the ordered‐dither method, depending upon image content, is described in detail. Finally, we propose an advanced CED algorithm for improving the gradation characteristics of the CED algorithm. The performance of the proposed algorithms is compared to the experimental results for natural test images. In order to verify the halftone quality, a structural similarity measure for color images by taking into account the interrelation between color channels is proposed, and the results based on the proposed method, the color similarity measure method, is given. |
