Quantification of spherical inclusions in the scanning electron microscope using Monte Carlo simulations期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Quantification of spherical inclusions in the scanning electron microscope using Monte Carlo simulations

Authors:	Raynald Gauvin Pierre Hovington Dominique Drouin

Abstract:

Keywords:	x-ray microanalysis Monte Carlo electron backscattering image generation