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New criterion for evaluating the aptitude of measurement systems in process capability determination |
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| Authors: | María Villeta Eva María Rubio Miguel Angel Sebastián Alfredo Sanz |
| Affiliation: | 1. Department of Statistics and Operational Research III, School of Statistics, Complutense University of Madrid (UCM), Av. Puerta de Hierro s/n, 28040, Madrid, Spain 2. Department of Manufacturing Engineering, Industrial Engineering School, National University of Distance Education (UNED), C/ Juan del Rosal, 12, 28040, Madrid, Spain 3. Department of Materials and Aerospace Production, Aeronautical Engineering School, Polytechnic University of Madrid (UPM), Pl. Cardenal Cisneros s/n, 28040, Madrid, Spain |
| Abstract: | In practice, carrying out statistical process control of manufacturing processes requires the use of measurement systems. These systems are not totally reliable because they are subject to inherent variability. This paper investigates the influence of measurement uncertainty on the analysis of manufacturing process capability. A new methodology is described that helps overcome the effect of measurement uncertainty in order to obtain a more accurate assessment of the capability of the production processes. This methodology presents a solution that ensures the metrological confirmation of the measurement processes, and it was developed for manufacturing processes centred at a nominal value and for off-centred processes. Moreover, an improved capability index integrated into the statistical process control is proposed for evaluating measurement systems. The index helps identify manufacturing process quality risks associated with uncertainty in measurement systems. |
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