| Quanta 400扫描电镜计量校准规范的编制 |
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| 引用本文： | 王庆英. Quanta 400扫描电镜计量校准规范的编制[J]. 武钢技术, 2006, 44(1): 13-17 |
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| 作者姓名： | 王庆英 |
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| 作者单位： | 武钢技术中心,湖北,武汉,430080 |
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| 摘 要： | 对检定与校准的区别，对如何编制校准规范进行论述。介绍大型精密检测设备Quanta400扫描电子显微镜的企业内部计量校准规范的编制与校准。
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| 关 键 词： | 校准规范 溯源 计量检测设备 |
| 文章编号： | 1008-4371（2006）01-0013-05 |
| 收稿时间： | 2005-09-08 |
| 修稿时间： | 2005-09-08 |
Stipulation of measurement specification for Quanta 400 scanning electronic microscope |
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| WANG Qing-ying. Stipulation of measurement specification for Quanta 400 scanning electronic microscope[J]. Wisco Technology, 2006, 44(1): 13-17 |
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| Authors: | WANG Qing-ying |
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| Affiliation: | Technology Center of WISCO, Wuhan 430080,China |
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| Abstract: | The present paper elucidates the difference between checking and calibration and describes how to draw up the calibration specification as well as how to work out and calibrate the enterprise internal measurement specification for the large sophisticated Scanning Electronic Microscope(SEM) Quanta 400. |
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| Keywords: | calibration specifications retrospect measurement and checking equipment |
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