首页 | 本学科首页   官方微博 | 高级检索  
     

利用介电特性的水果品质无损检测
引用本文:宋金亚,张立彬,计时鸣,张利.利用介电特性的水果品质无损检测[J].无损检测,2003,25(8):420-422.
作者姓名:宋金亚  张立彬  计时鸣  张利
作者单位:浙江工业大学,机电一体化研究所,杭州,310014
摘    要:简要介绍利用介电特性进行水果品质无损检测的现状、介电特性的基本概念和主要参数,并给出了介质损耗等效模型以及基于介电特性的无损检测装置及试验原理。利用该试验装置在低频段对不同苹果进行了检测,结果表明,在合适的频段范围内,苹果的电特性参数随频率按一定规律变化,检测所得参数基本上可以正确反映其实际品质状况。

关 键 词:水果  无损检测  介电性质  检测装置  介质损耗等效模型
文章编号:1000-6656(2003)08-0420-03
修稿时间:2003年2月27日

NONDESTRUCTIVE TESTING SYSTEM FOR FRUIT QUALITY BASED ON DIELECTRIC PROPERTY
SONG Jin ya,ZHANG Li bin,JI Shi ming,ZHANG Li.NONDESTRUCTIVE TESTING SYSTEM FOR FRUIT QUALITY BASED ON DIELECTRIC PROPERTY[J].Nondestructive Testing,2003,25(8):420-422.
Authors:SONG Jin ya  ZHANG Li bin  JI Shi ming  ZHANG Li
Abstract:The actualities of nondestructive inspection of fruit quality by means of dielectric property and the essential idea and parameters of dielectric property were presented briefly. The equivalent model of medium loss, the nondestructive inspection equipment based on dielectric property and the principle of experiment were given. The equipment was used to inspect apples in low frequency and the result showed that in the range of proper frequency, the parameters of apple dielectric property varied with frequency. Therefore the parameters could reflect the quality of apples on the whole.
Keywords:Nondestructive inspection  Dielectric property  Inspection equipment  Fruit
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号