Parasitic diffuse reflection in a Fourier transform spectrometer yielding subharmonic ghosts and line-shape distortion

When using a high-resolution Fourier transform spectrometer (FTS) in a cube-corner configuration, subharmonic ghosts are observed in the spectrum. These ghosts are attributable to parasitic diffuse reflections on the mirrors of the FTS arm. The reflected beams skip a part of the interferometer and travel a different path from the main beam thus experiencing a smaller optomechanical gain. These reflections are present in the reference laser channel as well as on the measurement channel, and each affect the estimated spectrum differently. The sampling grid generated by the reference laser has periodic errors that are synchronized with the fringe signal. The measured spectrum can therefore exhibit sampling jitter ghosts at submultiples of the reference laser wavenumber in addition to its own additive subharmonics. The diffuse reflection experiencing the nominal optomechanical gain, such as in a plane-mirror configuration, will impact directly on the instrument line shape and on the radiometric accuracy of the spectrometer since some radiation is not propagating at the expected angles in the instrument.