| 定量三维电子显微术及三维电子衍射 |
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| 引用本文： | 邹晓冬,万威. 定量三维电子显微术及三维电子衍射[J]. 电子显微学报, 2010, 29(3): 230-243 |
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| 作者姓名： | 邹晓冬 万威 |
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| 作者单位： | 邹晓冬,HOVM(O)LLER Sven(Inorganic/Structural Chemistry, Department of Materials and Environmental Chemistry,Stockholm university,SE-106 91 Stockholm,Sweden;Berzelii Centre EXSELENT on Porous Materials,Department of Materials and Environmental Chemistry,Stockholm university,SE-10);万威(Inorganic/Structural Chemistry, Department of Materials and Environmental Chemistry,Stockholm university,SE-106 91 Stockholm,Sweden) |
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| 基金项目： | 瑞典科学基金委员会，瑞典创新系统政府结构，瑞典Coeran Gustafsson基金委;瑞典Call-Trugger基金委支持项目 |
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| 摘 要： | 用电子晶体学可以确定尺度在微米甚至纳米级晶体的原子结构。它所要求的晶体尺寸比X射线晶体学所需的小百万倍。确定晶体的原子结构既可通过对高分辨电子显微像作图像处理,也可直接用电子衍射数据。同时还可将高分辨电子显微像和电子衍射数据与X射线粉末衍射结合起来确定晶体结构。如果晶体的单胞很大,原子在任何方向上的投影都有重叠,确定晶体的原子结构则需要拍摄一系列不同晶带轴的电子衍射图及高分辨像,再将其综合起来重构晶体的三维静电势图,以得到晶体的原子位置。本文将概括地介绍最近十几年中电子晶体学的一些最新进展及其在无机晶体结构解析方面的一些最新应用实例。
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| 关 键 词： | 电子晶体学 结构解析 晶体学图像处理 三维电子显微术 三维电子衍射 X射线粉末衍射 |
Quatatitive 3 D electron microscopy and 3D electron diffraction |
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| ZOU Xiao-dong,WAN Wei,HOVMLLER Sven. Quatatitive 3 D electron microscopy and 3D electron diffraction[J]. Journal of Chinese Electron Microscopy Society, 2010, 29(3): 230-243 |
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| Authors: | ZOU Xiao-dong WAN Wei HOVMLLER Sven |
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| Affiliation: | 1. Inorganic/Structural Chemistry, Department of Materials and Environmental Chemistry,Stockholm university,SE-106 91 Stockholm,Sweden;Berzelii Centre EXSELENT on Porous Materials,Department of Materials and Environmental Chemistry,Stockholm university,SE-106 91 Stockholm,Sweden
2. Inorganic/Structural Chemistry, Department of Materials and Environmental Chemistry,Stockholm university,SE-106 91 Stockholm,Sweden |
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| Abstract: | Electron crystallography can be used for determination of atomic structures of micrometer/nanometer-sized crystals,which are million times smaller than those required by X-ray crystallography.Structure determination at atomic resolution can be done from both high-resolution electron microscopy images combined with crystallographic image processing and electron diffraction data,or by combining them with powder X-ray diffraction data.Atoms may be overlapped in all projections if the unit cell of the crystal i... |
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| Keywords: | electron crystallography structure solution crystallographic image processing 3D electron microscopy 3D electron diffraction powder X-ray diffraction |
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