首页 | 本学科首页   官方微博 | 高级检索  
     

一种智能卡电性能可靠性的测试方法
引用本文:赵坤,时良平. 一种智能卡电性能可靠性的测试方法[J]. 电子质量, 2008, 0(3): 31-34
作者姓名:赵坤  时良平
作者单位:北京邮电大学自动化学院,北京,100876;北京邮电大学自动化学院,北京,100876
摘    要:随着智能卡以其自身高效、安全、便捷的特点在众多领域的应用,人们对其可靠性的要求也越来越高,因此有效的可靠性测试显得尤为重要。文章主要以接触式智能卡为例针对智能卡可靠性测试的一方面——电性能测试提出一种方便可行的测试方法。该方法在总结智能卡测试方法标准ISO/IEC10373的基础上,改进了相关测试项测试方法,根据实际情况补充了漏灌电流测试并详细说明其测试方法。根据测试需要设计了电性能全覆盖测试的程序,自动生成电性能测试报告。

关 键 词:智能卡  电性能  可靠性  测试
文章编号:1003-0107(2008)03-0031-04

A Test Method for Electrical Characteristics Reliability of Integrated Circuit(s) Cards
Zhao Kun,Shi Liang-ping. A Test Method for Electrical Characteristics Reliability of Integrated Circuit(s) Cards[J]. Electronics Quality, 2008, 0(3): 31-34
Authors:Zhao Kun  Shi Liang-ping
Abstract:Smart card has applied in many fields with its characteristics of efficiency,safety,and convenience.At the same time,there are increasing high requirements for the reliability of the smart cards.Effective reliability test methods appear to be particularly important.Take smart cards with contacts for example,a possible convenient test method in this paper is mainly about one part of the smart card reliability testing-electrical characteristics reliability testing.The method is based on the summary of test methods standard ISO/IEC10373.Some of the test methods for relevant electrical characteristics items are improved.According to the actual situation,irrigation current and leakage current tests are added to the whole test.Details of the test methods can be seen in this paper.Considering of the requirements of the test,the procedures is designed to cover all items of the electrical characteristics and automatically generate electrical characteristics test reports.
Keywords:Smart card  Reliability  Test  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号