The effect of composition,substrate temperature and annealing on the paramagnetic centres in SiO x /SnO co-evaporated thin films

The effects of composition and substrate temperature during evaporation and annealing, on the electron spin resonance spectra of co-evaporated SiO _x /SnO (300 nm) thin films have been investigated. The spin density is observed to decrease with increasing SnO content. This effect is attributed to the saturation of some of the paramagnetic defects such as dangling bonds and other structural defects like E₁ centres. The decrease in spin density in the composite thin films of SiO _x /SnO of constant thickness and composition with annealing and with increase in the substrate temperature during evaporation, is related to the conversion of some of the paramagnetic E₁ centres to E₁ (probable non-paramagnetic precursor of E₁) centres as well as to the saturation of some of the dangling bonds.