Enhancement of giant dielectric response in Ga-doped CaCu3Ti4O12 ceramics

The influences of Ga³⁺ doping ions on the microstructure, dielectric and electrical properties of CaCu₃Ti₄O₁₂ ceramics were investigated systematically. Addition of Ga³⁺ ions can cause a great increase in the mean grain size of CaCu₃Ti₄O₁₂ ceramics. This is ascribed to the ability of Ga³⁺ doping to enhance grain boundary mobility. Doping CaCu₃Ti₄O₁₂ with 0.25 mol% of Ga³⁺ caused a large increase in its dielectric constant from 5439 to 31,331. The loss tangent decreased from 0.153 to 0.044. The giant dielectric response and dielectric relaxation behavior can be well described by the internal barrier layer capacitor model based on Maxwell?Wagner polarization at grain boundaries. The nonlinear coefficient, breakdown field, and electrostatic potential barrier at grain boundaries decreased with increasing Ga³⁺ content. Our results demonstrated the importance of ceramic microstructure and electrical responses of grain and grain boundaries in controlling the giant dielectric response and dielectric relaxation behavior of CaCu₃Ti₄O₁₂ ceramics.     

Structural and dielectric properties,and nonlinear electrical response of the CaCu3-xZnxTi4O12 ceramics: Experimental and computational studies

CaCu_3-xZn_xTi₄O₁₂ ceramics (x = 0, 0.05, 0.10) were successfully prepared by a conventional solid-state reaction method. Their structural and dielectric properties, and nonlinear electrical response were systematically inspected. The X-ray diffraction results indicated that single-phase CaCu₃Ti₄O₁₂ (JCPDS no. 75–2188) was obtained in all sintered ceramics. Changes in the lattice parameter are well-matched with the computational result, indicating an occupation of Zn²⁺ doping ions at Cu²⁺ sites. The overall tendency shows that the average grain size decreases when x increases. Due to a decrease in overall grain size, the dielectric permittivity of CaCu_3-xZn_xTi₄O₁₂ decreases expressively. Despite a decrease in the dielectric permittivity, it remains at a high level in the doped ceramics (~3,406–11,441). Besides retention in high dielectric permittivity, the dielectric loss tangent of x = 0.05 and 0.10 (~0.074–0.076) is lower than that of x = 0 (~0.227). A reduction in the dielectric loss tangent in the CaCu_3-xZn_xTi₄O₁₂ ceramics is closely associated with the enhanced grain boundary response. Increases in grain boundary resistance, breakdown electric field, and conduction activation energy of grain boundary as a result of Zn²⁺ substitution are shown to play a crucial role in improved grain boundary response. Furthermore, the XPS analysis shows the existence of Cu⁺/Cu²⁺ and Ti³⁺/Ti⁴⁺, indicating charge compensation due to the loss of oxygen lattice. Based on all results of this work, enhanced dielectric properties of the Zn-doped CCTO can be explained using the internal barrier layer capacitor model.     

Extremely Enhanced Nonlinear Current–Voltage Properties of Tb‐Doped CaCu3Ti4O12 Ceramics

Nonlinear current–voltage properties of CaCu₃Ti₄O₁₂ ceramics were extremely enhanced by doping with Tb. Substitution of Tb to CaCu₃Ti₄O₁₂ resulted in a decrease in grain size due to the ability of Tb ions to inhibit grain boundary mobility. The dielectric properties of CaCu₃Ti₄O₁₂ ceramics were degraded after doping with Tb. Surprisingly, the nonlinear electrical properties were strongly enhanced. The best properties with a nonlinear coefficient of ~29.67 and breakdown electric field strength of ~1.52 × 10⁴ V/cm were obtained in the Ca_0.775Tb_0.15Cu₃Ti₄O₁₂ ceramic. These extremely enhanced properties were attributed to modification of grain boundary electrical response due to the effect Tb substitution.     

Origin of significantly enhanced dielectric response and nonlinear electrical behavior in Ni2+-doped CaCu3Ti4O12: Influence of DC bias on electrical properties of grain boundary and associated giant dielectric properties

CaCu_3-xNi_xTi₄O₁₂ (x?=?0, 0.05, and 0.10) powders were synthesized using a solid state reaction method. Phase structure and microstructure analyses revealed that all sintered CaCu_3-xNi_xTi₄O₁₂ ceramics were of a pure phase. The CaCu₃Ti₄O₁₂ ceramics had a dense microstructure and grain sizes were enlarged by doping with Ni²⁺. Interestingly, the dielectric permittivity was significantly enhanced, whereas the loss tangent was greatly suppressed to ～0.046–0.034 at 1?kHz. All sintered ceramics exhibited non-Ohmic characteristics. Clarification of the influences of DC bias showed that the dielectric permittivity and loss tangent values were increased by DC bias. The resistance of grain boundaries and the associated conduction activation energy of CaCu_3-xNi_xTi₄O₁₂ ceramics were reduced as the DC bias voltage increased. Therefore, the observed non-Ohmic behavior and significantly enhanced dielectric properties should be closely related to variation in the Schottky barriers at the grain boundaries.     

Enhancing giant dielectric properties of Ta5+-doped Na1/2Y1/2Cu3Ti4O12 ceramics by engineering grain and grain boundary

Various strategies to improve the dielectric properties of ACu₃Ti₄O₁₂ (A = Sr, Ca, Ba, Cd, and Na_1/2Bi_1/2) ceramics have widely been investigated. However, the reduction in the loss tangent (tanδ) is usually accompanied by the decreased dielectric permittivity (ε′), or vice versa. Herein, we report a route to considerably increase ε′ with a simultaneous reduction in tanδ in Ta⁵⁺–doped Na_1/2Y_1/2Cu₃Ti₄O₁₂ (NYCTO) ceramics. Dense microstructures with segregation of Cu– and Ta–rich phases along the grain boundaries (GBs) and slightly increased mean grain size were observed. The samples prepared via solid-state reaction displayed an increase in ε′ by more than a factor of 3, whereas tanδ was significantly reduced by an order of magnitude. The GB–conduction activation energy and resistance raised due to the segregation of Cu/Ta–rich phases along the GBs, resulting in a decreased tanδ. Concurrently, the grain–conduction activation energy and grain resistance of the NYCTO ceramics were reduced by Ta⁵⁺ doping ions owing to the increased Cu⁺/Cu²⁺, Cu³⁺/Cu²⁺, and Ti³⁺/Ti⁴⁺ ratios, resulting in enhanced interfacial polarization and ε′. The effects of Ta⁵⁺ dopant on the giant dielectric response and electrical properties of the grain and GBs were described based on the Maxwell–Wagner polarization at the insulating GB interface, following the internal barrier layer capacitor model.     

Significantly enhanced breakdown field with high grain boundary resistance and dielectric response in 0.1Na0.5Bi0.5TiO3-0.9BaTiO3 doped CaCu3Ti4O12 ceramics

Electrical performances are strongly associated with the electrical heterogeneity of grains and grain boundaries for CaCu₃Ti₄O₁₂ (CCTO) ceramics. In this work, the dielectric ceramics of 0.1Na_0.5Bi_0.5TiO₃-0.9BaTiO₃ (NBT-BT) doped CCTO were fabricated by a conventional solid-state reaction method, and the ceramics were sintered at 1100 °C for 6 h. Relatively homogeneous microstructures are obtained, and the average grain sizes are characterized about 0.9∼1.5 μm. Impressively, a significantly enhanced breakdown field of 13.7 kV/cm and a noteworthy nonlinear coefficient of 19.4 as well as a lower dielectric loss of 0.04 at 1 kHz are achieved in the 0.94CCTO-0.06(NBT-BT) ceramics. It is found that the improved electrical properties are attributed to the increased grain boundary resistance of 3.7 × 10⁹ Ω and the Schottky barrier height of 0.7 eV. This is originated from the NBT-BT compound doping effect. This work demonstrates an effective approach to improve electrical properties of CCTO ceramics by NBT-BT doping.     

Giant dielectric behavior of monovalent cation/anion (Li+, F−) co-doped CaCu3Ti4O12 ceramics

Giant dielectric behavior and electrical properties of monovalent cation/anion (Li⁺, F⁻) co-doped CaCu₃Ti₄O₁₂ ceramics prepared by a solid-state reaction route were systematically investigated. Substitution of Li⁺ and F⁻ led to a significantly enlarged mean grain size. A reduced loss tangent (tanδ ~0.06) with the retainment of an ultra-high dielectric permittivity (ε′ ~7.7-8.8 × 10⁴) was achieved in the co-doped ceramics, while the breakdown electric field and nonlinear coefficient of CaCu₃Ti₄O₁₂ ceramics were increased by co-doping with (Li⁺, F⁻). The variations in nonlinear electrical properties and giant dielectric response, as well as the dielectric relaxation, were well explained by the Maxwell-Wagner polarization model for an electrically heterogeneous microstructure, in which a Schottky barrier height at the grain boundaries (GBs) was formed. ε′ was closely correlated to the GB capacitance. Significantly decreased tanδ value and enhanced nonlinear properties were related to a significant increase in the GB resistance, which was attributed to the significantly increased potential barrier height and conduction activation energy at the GBs. The semiconducting nature of the grains was also studied using X-ray photoelectron spectroscopy and found to originate from the presence of Cu⁺ and Ti³⁺ ions.     

Ge4+ doped CaCu2.95Zn0.05Ti4O12 ceramics: Two-step reduction of loss tangent

CaCu₃Ti₄O₁₂ ceramics have been extensively studied for their potential applications as capacitors in recent years; however, these materials exhibit very large dielectric losses. A novel approach to reducing the dielectric loss tangent in two steps, while increasing the dielectric permittivity, is presented herein. Doping CaCu₃Ti₄O₁₂ with a Zn dopant reduces the loss tangent of the ceramic material from 0.227 to 0.074, which is due to the increase in grain boundary (GB) resistance by an order of magnitude (from 6.3× 10³ to 3.93 × 10⁴ Ω cm). Zn-doping slightly changes the microstructure and dielectric permittivity of the CaCu₃Ti₄O₁₂ ceramic, which reveals that the primary role of the Zn dopant is to tune the intrinsic properties of the GBs. Surprisingly, the addition of the Ge⁴⁺ dopant into the Zn²⁺-doped CaCu₃Ti₄O₁₂ ceramic sample led to a further decrease in the loss tangent from 0.074 to 0.014, due to enhanced GB resistance (3.1 × 10⁵ Ω cm). The grain size increased remarkably from 2–3 μm to 85–90 μm, corresponding to a significant increase in the dielectric permittivity (~1–4 × 10⁴). The large increase in GB resistance is due to the intrinsic potential barrier height at the GBs and the segregation of the Cu-rich phase in the GB region. First-principles calculations revealed that Zn and Ge are preferentially located at the Cu sites in the CaCu₃Ti₄O₁₂ structure. The substitution of the Ge dopant does not hinder the role of the Zn dopant in terms of improving the electrical properties at the GBs. These phenomena are effectively explained by the internal barrier layer capacitor model. This study provides a way of improving the dielectric properties of ceramics for their practical use as capacitors.     

Effect of cesium and cerium substitution on the dielectric properties of CaCu3Ti4O12 ceramics

In this study, CaCu₃Ti₄O₁₂ (CCTO) ceramics were doped with cesium and cerium atoms to possibly improve the electrical properties of these widely used ceramics. In all cases, pure phase perovskites were produced where cesium doping enhanced the grain growth and cerium doping produced grain growth inhibition. The cesium doping showed an improvement in loss tangent performance, in contrast to the cerium doping which showed a negative result. A high dielectric constant >15,000 with a dielectric loss lower than 0.06 was observed for cesium 2.0 mol% doped at high frequencies. These results were related to the change in microstructure and the properties of grain boundary after doping.     

Influence of Sb-doping on dielectric properties of NaCu3Ti3TaO12 ceramics and relevant mechanism(s)

A series of NaCu₃Ti₃Ta_1−xSb_xO₁₂ ceramics were prepared by the conventional solid-state reaction technique, and their dielectric properties, crystalline structures, microstructures and complex impedance were investigated systematically. All the ceramics show the main phases of perovskite-related crystallographic structure, and their dielectric properties change significantly with the increasing Sb-doping. All these ceramics exhibit giant dielectric-permittivity properties, and impedance spectroscopy analysis reveals that NaCu₃Ti₃Ta_1−xSb_xO₁₂ ceramics are electrically heterogeneous and composed of insulating grain boundaries and semiconducting grains. Moreover, CuO secondary phase and Cu²⁺/Cu¹⁺, Ti⁴⁺/Ti³⁺, Sb⁵⁺/Sb³⁺ and Ta⁵⁺/Ta³⁺ aliovalences are found to exist in NaCu₃Ti₃Ta_1−xSb_xO₁₂ ceramics through XRD, EDS and XPS analysis. Therefore, CuO segregation and aliovalences of metal ions were suggested to contribute greatly to the internal barrier layer capacitance effect formation in NaCu₃Ti₃Ta_1−xSb_xO₁₂ ceramics. Furthermore, Sb-doping could decrease the tanδ of NaCu₃Ti₃Ta_1−xSb_xO₁₂ ceramics at low frequencies, and the reason was discussed.     

Improved non-ohmic and dielectric properties of Cr3+ doped CaCu3Ti4O12 ceramics prepared by a polymer pyrolysis solution route

CaCu_3-xCr_xTi₄O₁₂ (x?=?0.00–0.20) ceramics were prepared via a polymer pyrolysis solution route. Their dielectric properties were improved by Cr³⁺ doping resulting in an optimal dielectric constant value of 7156 and a low tanδ?value of 0.092 in a sample with x?=?0.08. This might have resulted from a decrease in oxygen vacancies at grain boundaries. XANES spectra confirmed the presence of Cu⁺ ions in all ceramic samples with a decreasing Cu⁺/Cu²⁺ ratio due to an increased content of Cr³⁺ ions. All CaCu_3-xCr_xTi₄O₁₂ ceramics showed nonlinear characteristic with improvement in both the breakdown field (E_b) and its nonlinear coefficient (α). Interestingly, the highest values of α, ～ 114.4, and that of E_b, ～8455.0?±?123.6?V?cm^?1, were obtained in a CaCu_3-xCr_xTi₄O₁₂ sample with x?=?0.08. The improvement of dielectric and nonlinear properties suggests that they originate from a reduction of oxygen vacancies at grain boundaries.     

Electrical Conduction and Dielectric Properties of the Rb‐doped CaCu3Ti4O12

Ca_1?xRb_xCu₃Ti₄O₁₂ (x = 0, 0.03, and 0.05) ceramics were synthesized by the sol‐gel method. Their microstructure and electrical properties were investigated. In the Rb‐doped samples, the Cu‐rich and Ti‐poor grain‐boundary layers are formed, and electrical properties are also changed by doping: With the increase in doping concentration, the grain resistivity and the grain‐boundary Schottky potential barrier are changed, the grain‐boundary resistivity is enhanced, and the low‐frequency dielectric constants and loss are reduced. These results were discussed in terms of the internal barrier layer capacitor (IBLC) mechanism, particularly focusing on the electrical properties in grains and the cationic nonstoichiometry at grain boundaries.     

(Al3+, Nb5+) co–doped CaCu3Ti4O12: An extended approach for acceptor–donor heteroatomic substitutions to achieve high–performance giant–dielectric permittivity

Substitution of (Al³⁺, Nb⁵⁺) co–dopants into TiO₆ octahedral sites of CaCu₃Ti₄O₁₂ ceramics, which were prepared by a solid state reaction method and sintered at 1090 °C for 18 h, can cause a great reduction in a low–frequency loss tangent (tanδ≈0.045–0.058) compared to those of Al³⁺ or Nb⁵⁺ single–doped CaCu₃Ti₄O₁₂. Notably, very high dielectric permittivities of 2.9 ? 4.1 × 10⁴ with good dielectric–temperature stability are achieved. The room–temperature grain boundary resistance (R_gb≈0.37–1.17 × 10⁹ Ω.cm) and related conduction activation energy (E_gb≈0.781–0.817 eV), as well as the non–Ohmic properties of the co–doped ceramics are greatly enhanced compared to single–doped ceramics (R_gb≈10⁴–10⁶ Ω cm and E_gb≈0.353–0.619 eV). The results show the importance of grain boundary properties for controlling the nonlinear–electrical and giant–dielectric properties of CaCu₃Ti₄O₁₂ ceramics, supporting the internal barrier layer capacitor model of Schottky barriers at grain boundaries.     

Effect of Ta2O5 in (Ca,Si, Ta)-doped TiO2 ceramic varistors

TiO₂ varistors doped with 0.2 mol% Ca, 0.4 mol% Si and different concentrations of Ta were obtained by ceramic sintering processing at 1350 °C. The effect of Ta on the microstructures, nonlinear electrical behavior and dielectric properties of the (Ca, Si, Ta)-doped TiO₂ ceramics were investigated. The ceramics have nonlinear coefficients of α = 3.0–5.0 and ultrahigh relative dielectric constants which is up to 10⁴. Experimental evidence shows that small quantities of Ta₂O₅ improve the nonlinear properties of the samples significantly. It was found that an optimal doping composition of 0.8 mol% Ta₂O₅ leads to a low breakdown voltage of 14.7 V/mm, a high nonlinear constant of 4.8 and an ultrahigh electrical permittivity of 5.0 × 10⁴ and tg δ = 0.66 (measured at 1 kHz), which is consistent with the highest and narrowest grain boundary barriers of the ceramics. In view of these electrical characteristics, the TiO₂–0.8 mol% Ta₂O₅ ceramic is a viable candidate for capacitor–varistor functional devices. The characteristics of the ceramics can be explained by the effect and the maximum of the substitution of Ta⁵⁺ for Ti⁴⁺.     

Microstructural evolution,non‐Ohmic properties,and giant dielectric response in CaCu3Ti4−xGexO12 ceramics

The microstructural evolution, non‐Ohmic properties, and giant dielectric properties of CaCu₃Ti_4?xGe_xO₁₂ ceramics (x=0‐0.10) are systematically investigated. The Rietveld refinement confirms the existence of a pure CaCu₃Ti₄O₁₂ phase in all samples. Significantly enlarged grain sizes of CaCu₃Ti_4?xGe_xO₁₂ ceramics are associated with the liquid phase sintering mechanism. Enhanced dielectric permittivity from 6.90×10⁴ to 1.08×10⁵ can be achieved by increasing Ge⁴⁺ dopant from x=0‐0.10, whereas the loss tangent is remarkably reduced by a factor of ≈10. Non‐Ohmic properties are enhanced by Ge⁴⁺ doping ions. Using impedance and admittance spectroscopies, the underlying mechanisms for the dielectric and nonlinear properties are well described. The improved nonlinear properties and reduced loss tangent are attributed to the enhanced resistance and conduction activation energy of the grain boundaries. The largely enhanced permittivity is closely associated with the enlarged grain sizes and the increase in the Cu⁺/Cu²⁺ and Ti³⁺/Ti⁴⁺ ratios, which are calculated from the X‐ray absorption near‐edge structure.     

Effect of Sn4+–Isovalent doping concentration on giant dielectric properties of SnxTa0.025Ti0.975-xO2 ceramics

The Sn_xTa_0.025Ti_0.975-xO₂ (x%Sn(TTO)) ceramics with x = 2.5–10% were prepared using a standard mixed-oxide method and sintered at 1450 °C for 3 h to achieve a dense microstructure. The effects of the isovalent–Sn⁴⁺ doping concentration on the crystal structure, microstructure, giant dielectric behavior, and electrical properties were systematically investigated. Continuously enlarged lattice parameters and bond lengths with a single rutile–TiO₂ phase were observed as x% increased. The mean grain size was slightly reduced (～17.3–14.6 μm) due to an increased oxygen vacancy and the solute drag effect. The dielectric permittivity (ε′) decreased with increasing x%, whereas the loss tangent (tanδ) was remarkably reduced. The semiconducting grain resistance of the x%Sn(TTO) ceramics remained unchanged owing to the same Ta⁵⁺ donor concentration. The insulating grain boundary (GB) resistance was extremely increased by more than two orders of magnitude when x% increased from 2.5 to 5.0%, leading to the significantly improved giant dielectric properties. The optimized low tanδ～0.02 and high ε′～10⁴ with temperature coefficient less than ±15% in the range of -60–210 °C were reasonably described by the internal barrier layer capacitor model. Improved dielectric properties can be obtained by engineering GB by varying the Sn⁴⁺–isovalent doping concentration. This study provides an important approach for improving the dielectric properties of co–doped TiO₂ without the creation of complex defect clusters inside the grains.     

Microstructural evolution and dielectric properties of SiO2-doped CaCu3Ti4O12 ceramics

The abnormal grain growth (AGG) behavior of undoped and SiO₂-doped CaCu₃Ti₄O₁₂ (CCTO) ceramics were investigated. With the addition of 2 wt.% SiO₂, the AGG-triggering temperature decreased from 1100 to 1060 °C, and the temperature for obtaining a uniform and coarse microstructure decreased from 1140 to 1100 °C. The lowering of the AGG temperature by SiO₂ addition was attributed to the formation of a CuO-SiO₂-rich intergranular phase at lower temperature. The apparent dielectric permittivity of coarse SiO₂-doped CCTO ceramics was ∼10 times higher than that of fine SiO₂-doped CCTO ceramics at the frequency of 10³–10⁵ Hz. The doping of SiO₂ to CCTO ceramics provides an efficient route of improving the dielectric properties via grain coarsening. The correlation between the microstructure and apparent permittivity suggests the presence of a barrier layer near the grain boundary.     

Improved dielectric and nonlinear properties of CaCu3Ti4O12 ceramics with Cu-rich phase at grain boundary layers

The formation and compositions of grain boundary layers are very important factors to improve the electrical properties of CaCu₃Ti₄O₁₂ (CCTO) ceramics. In present work, the dielectric and nonlinear properties of the CCTO ceramics are enhanced by controlling the Cu-rich phase degree at grain boundary layers. The dense CCTO ceramics were prepared successfully through mixing the nanometer and micrometer powders and using the cold isostatic pressing process. The average grain size of these CCTO ceramics is about 30.71(±11.76) ∼ 62.01(±32.16) μm, and their grain microstructures show the Cu-rich phases at grain boundary layers. The CCTO ceramics with the mass ratios of nanometer and micrometer powders 7:3 display a giant dielectric constant of 5.4 × 10⁴, low dielectric loss of 0.048 at 10³ Hz, enhanced nonlinear coefficients of 11.12, as well as the noteworthy breakdown field of 4466.17 V/cm. The complex impedance spectroscopy results indicate that the giant dielectric behavior is due to the electrically heterogeneous grain/grain boundary characteristics from internal barrier layer capacitance (IBLC) model. The lower dielectric loss and the higher breakdown field are attributed to the high resistance grain boundary layers with the Cu-rich phase. The improved nonlinear properties are related to the increased Schottky barrier height at grain boundary. This work may provide a potential way to design the CCTO ceramics with excellent electrical properties from the viewpoint of controlling the response of the Cu-rich phase grain boundary.     

A novel strategy to enhance dielectric performance and non-Ohmic properties in Ca2Cu2−xMgxTi4O12

A novel strategy to improve the dielectric and non-Ohmic properties of CaCu₃Ti₄O₁₂ ceramics that deliberately created a binary-phase system of CaCu_3−xMg_xTi₄O₁₂/CaTiO₃ was proposed and can be performed with a starting nominal formula of Ca₂Cu_2−xMg_xTi₄O₁₂. Mg²⁺ doping ions were preferentially incorporated only into the CaCu₃Ti₄O₁₂ phase. Substitution of Mg²⁺ into CaCu₃Ti₄O₁₂/CaTiO₃ can cause a significant increase in dielectric permittivity and a large reduction of the loss tangent to <0.015 at 1 kHz; while, retaining excellent temperature dielectric-stability. Sintering time had a slight influence on the dielectric properties, but remarkable effects upon the nonlinear electrical properties of CaCu_3−xMg_xTi₄O₁₂/CaTiO₃ ceramics. Degradation of nonlinear properties with increased sintering time is suggested to be the result of the dominant effect of oxygen vacancies. Impedance spectroscopy analysis demonstrated that improved dielectric and nonlinear properties could be attributed to the enhanced electrical responses of CaCu₃Ti₄O₁₂–CaTiO₃ and CaCu₃Ti₄O₁₂–CaCu₃Ti₄O₁₂ interfaces resulting from Mg²⁺ doping ions.     

Preparation of CaCu3Ti4O12 ceramics with low dielectric loss and giant dielectric constant by the sol–gel technique

CaCu₃Ti₄O₁₂ precursor powders were synthesized by the sol–gel process. The optimized processing parameters for the synthesis of precursor powders were as follows: the Ti concentration was 0.60 mol/L, the pH value of the sol was 1.58, and the aging time of the sol was 6 h. After sintering at 1100 °C for 15 h, the CCTO ceramics with the highest density and fine-grained microstructure were obtained, exhibiting outstanding dielectric properties: ε′≈3.50×10⁴ and tan δ=0.014 (at 1 kHz). The low dielectric loss was attributed to the highest grain boundary resistance which significantly reduced the leakage current across grain boundaries. A broad dielectric relaxation peak was observed around 300 °C. The complex impedance spectroscopy analysis suggested that the obtained CaCu₃Ti₄O₁₂ ceramics were electrically heterogeneous, consisting of semiconducting grains and insulating grain boundaries. The calculated grain boundary resistance and grain resistance were 0.87 MΩ and 3.50 Ω, respectively.