FC-PBGA644封装的热仿真模拟

FC-PBGA(Filp Chip-PBGA)倒装球栅格阵列封装相比BGA封装易于实现高密度封装,具有更好的电性能和热性能。利用有限元分析软件对封装产品进行建模仿真计算,添加各自的材料热导热系数、边界条件等,在产品设计研发阶段获得温度分布云图。通过计算其热阻,同时对此封装产品散热性能进行优化改进,得出基板尺寸的最优参数设计,可以通过添加散热盖改善其散热性能,提高产品可靠性。     

铜柱法协同高导热介质提升和封装基板散热能力提升研究

本文介绍了一种封装基板散热效能提升方案,通过同时采用高导热封装基板材料和铜柱法工艺,实现封装基板的热导率得到显著提升。本研究的重点是封装载板的热性能,从基板材料和封装基板工艺制备的角度出发,对高导热率封装基板材料进行工艺的可靠性分析和实验验证。此外,还提供了封装基板材料的热导率和相应封装载板产品的热扩散系数测试方法及测试结果的讨论。同时,对比研究了高导热率的封装基板材料和传统的封装基板材料分别应用于与铜柱法工艺和激光工艺。实验结果表明,由于铜柱法可以实现实心互联结构且侧壁光滑,高导热率封装基板材料结合铜柱法可实现最优的散热效果,对应的封装载板产品的热扩散系数和热导率较传统的封装基板材料分别提升60%和2.6倍,在未来芯片和模组封装热管理中具备显著的优势和潜力。     

基于高导热率石墨膜的GaN半桥功率器封装散热研究北大核心CSCD

本文针对激光雷达转镜扫描电机对调速精度、频率和运动幅度的需求,提出了一种基于高热导率石墨膜的GaN半桥功率器封装方案。仿真结果表明,与环氧玻璃布层压板(FR-4)基板、FR-4基板+铜散热片、陶瓷基板三种散热结构相比,采用FR-4基板+导热石墨膜散热结构的GaN半桥功率器,制备成本较低、工艺复杂度可控、成品质量轻、散热性能好,最高可降温32.6℃,散热性能可提升29.6%。导热底部填充胶起到热耦合作用,在石墨膜封装结构中不可或缺。换热系数可影响散热性能,在其他散热影响因素无法再优化情况下,可通过增加换热系数提高散热效果。本文研究结果对高频、高功率密度、小尺寸功率器件封装热设计具有一定的参考和指导意义。     

电子系统封装器件的传热研究

开发了一个电子系统封装(SIP)典型器件的传热模型,用数值方法模拟了器件的热传递过程和温度分布状况,探讨了各种设计参数和物性参数对温度场的影响。计算结果表明:当t = 1 400 s,以LCP为基板时SIP器件传热过程达到稳定态,基板导热系数和对流换热系数是影响器件散热速率的关键参数,此外还计算了对于不同的环境对流换热系数和不同基板材料,不使芯片产生热失效所允许的输入功率耗散密度。这为研究高密度电子封装器件的热特性,进一步改善器件的热性能提供了理论依据。     

ASTM D5470方法测试金属基覆铜板导热系数的影响因素

导热系数是表征材料散热性能的重要参数之一，在金属基板领域应用广泛。本文主要介绍美国材料试验协会稳态热流法ASTM D5470的测试标准及原理，从测试参数（压力和时间）、导热膏（热阻抗测试方法和特性）、试样（表面粗糙度和形状尺寸）等方面，分析对金属基覆铜板导热系数测试结果的影响，以期为测试人员提供参考及获得更加精确数据。     

功率型LED模组基板横/纵向散热性能研究

为了研究LED模组的散热性能,对其基板的横向和纵向散热性能进行了对比研究。首先建立加快基板横向和纵向散热性能的有限元模型,即在基板上覆盖高导热层和基板内添加高热导率热沉结构。并运用有限元(FEM)分析方法对两种基板的散热效果以及基板和LED芯片温度分布的均匀性进行了对比分析。最后,对于基板上覆盖高导热层的结构,结合实际工艺和散热性能的考虑,进一步优化了高导热层的厚度。     

新型封装材料与大功率LED封装热管理

高效散热封装材料的合理选择和有效使用是提高大功率LED(发光二极管)封装可靠性的重要环节。在分析封装系统热阻对LED性能的影响及对传统散热封装材料性能进行比较的基础上,阐述了金属芯印刷电路板材料、金属基绝缘板材料、陶瓷基板材料、导热界面材料和金属基复合材料结构特点、导热性能及其封装应用实例。指出了封装材料的研究重点和亟待解决的问题。     

基于ANSYS的功率VDMOS器件的热分析及优化设计

针对TO-220 AB封装形式的功率VDMOS器件,运用有限元法建立器件的三维模型,对功率耗散条件下器件的温度场进行热学模拟和分析,研究了基板厚度、粘结层材料及粘结层厚度对器件温度分布的影响.分析结果表明,由芯片至基板的热通路是器件的主要散热途径.基板最佳厚度介于1～1.2 mm之间,且枯结层的导热系数越大、厚度越薄,越有利于器件的散热.     

基于有限元方法的光纤加速度计灵敏度仿真分析

散热是大功率LED封装的关键技术之一,散热基板的选用直接影响到LED器件的使用性能与可靠性。文章详细介绍了LED封装基板的发展现状,对比分析了树脂基板、金属基板、陶瓷基板、硅基板的结构特点与性能。最后预测了今后大功率LED基板的发展趋势及需要解决的问题。 更多还原     

大功率LED封装基板技术与发展现状

散热是大功率LED封装的关键技术之一,散热基板的选用直接影响到LED器件的使用性能与可靠性.文章详细介绍了LED封装基板的发展现状,对比分析了树脂基板、金属基板、陶瓷基板、硅基板的结构特点与性能.最后预测了今后大功率LED基板的发展趋势及需要解决的问题.     

Thermal analysis of a flip chip ceramic ball grid array (CBGA) package

The function of an electronic cooling package is to dissipate heat to ensure proper operation and reliability. The flip chip ball grid array package is probably the most suitable package for high-level thermal performance applications. A high thermal performance flip chip ceramic ball grid array (FC-CBGA) package with an aluminum silicon carbide (AlSiC) lid and one without lid were evaluated using the computational fluid dynamics (CFD) technique. This paper compares the thermal performance of a 35 × 35 mm FC-CBGA package with three different die sizes of 5 × 5 mm, 15 × 15 mm and 20 × 20 mm. The performance of a lid fitted with different heat sinks was investigated in standard JEDEC defined natural and in forced convection environments. Thermal measurements were performed using a functional application specific integrated circuit (ASIC) chip, in compliance with the JEDEC standards. Excellent agreement was found between the numerical results and the measured data. Improved thermal performance was observed with a lidded package as compared to the unlidded one. However, no significant improvement was observed between lidded and unlidded packages when fitted with a heat sink subjected to forced convection. This paper also discusses the package thermal budget estimate with and without heat sinks. Printed circuit board and package top surface temperature patterns were measured using an infrared thermal camera. The usefulness of the thermal characterization parameter is demonstrated in system level applications. Parametric studies were carried out to understand the effect of die size, radiation effect, gird size variations and airflow rate on die junction temperature and package thermal resistance. This study also incorporates the effects of substrate, lid, die and PCB temperatures for different die sizes in natural and forced convection environments.     

Thermal performance impacts of heat spreading lids on flip chip packages: With and without heat sinks

Heat spreading lids on a flip chip package can provide many thermal and mechanical advantages. Major drawbacks are higher module costs and potentially poorer thermal performance with a heat sink. This study compares thermal performance of direct lid attach (DLA) and bare die flip chip packages and addresses the roles of interface resistance and lid thickness. The IBM SLC^TM package is tested and modeled. JEDEC standard wind tunnel tests as well as CFD models are used for analysis. The study reveals that the DLA design without additional heat sinking can provide significantly better thermal performance compared to the bare die package, depending on package size and airflow rate. With a heat sink the performance of the lidded package can be superior or inferior depending on interface resistance, lid design and the standard used for comparison.     

An investigation of thermal enhancement on flip chip plastic BGApackages using CFD tool

This paper demonstrates the advantage of applying Predictive Engineering in the thermal assessment of a 279 inputs/outputs (I/Os), six-layer, depopulated array flip chip PBGA package. Thermal simulation was conducted using a computational fluid dynamics (CFD) tool to analyze the heat transfer and fluid flow in a free convection environment. This study first describes the modeling techniques on a multilayer substrate, thermal vias, solder bumps, and printed circuit board (PCB). For a flip chip package without any thermal enhancement, more than 90% of the total power was conducted from the front surface of the die through the solder ball interconnects to the substrate, then to the board. To enhance the thermal performance of the package, the heat transfer area from the backside of the die needs to increase dramatically. Several thermal enhancing techniques were examined. These methods included a copper heat spreader with various thicknesses and with thermal pads, metallic lid, overmolded with and without a heat spreader, and with heat sink. An aluminum lid and a heat sink gave the best improvement; followed by a heat spreader with thermal pads. Both methods reduced thermal resistance by an average of 50%. Detailed analyses on heat flow projections are discussed     

Exposed Die-Top Encapsulation Molding for an Improved High- Performance Flip Chip BGA Package

The recent advancement in high- performance semiconductor packages has been driven by the need for higher pin count and superior heat dissipation. A one-piece cavity lid flip chip ball grid array (BGA) package with high pin count and targeted reliability has emerged as a popular choice. The flip chip technology can accommodate an I/O count of more than five hundreds500, and the die junction temperature can be reduced to a minimum level by a metal heat spreader attachment. None the less, greater expectations on these high-performance packages arose such as better substrate real estate utilization for multiple chips, ease in handling for thinner core substrates, and improved board- level solder joint reliability. A new design of the flip chip BGA package has been looked into for meeting such requirements. By encapsulating the flip chip with molding compound leaving the die top exposed, a planar top surface can be formed. A, and a flat lid can then be mounted on the planar mold/die top surface. In this manner the direct interaction of the metal lid with the substrate can be removed. The new package is thus less rigid under thermal loading and solder joint reliability enhancement is expected. This paper discusses the process development of the new package and its advantages for improved solder joint fatigue life, and being a multichip package and thin core substrate options. Finite-element simulations have been employed for the study of its structural integrity, thermal, and electrical performances. Detailed package and board-level reliability test results will also be reported     

倒装陶瓷球栅阵列电子封装的热分析

建立了倒装陶瓷球栅阵列(flip chip ceramic ball grid array,FC-CBGA)封装的三维热模型。在5 W热负荷下,比较了裸芯片式、盖板式和盖板加装热沉三种情况下芯片的热性能,进而分析了有无热沉和不同空气流速下,盖板式封装的具体热流分配情况。结果表明:在自然对流下,与裸芯片式相比,采用盖板式能使芯片结点温度降低约16℃,盖板加装热沉能使芯片结温降低47℃。芯片产生的热量大部分向上流向盖板,且随着空气流速的增加比例增大;由芯片流向盖板的热量有相当大一部分经过侧面流向基板,且随着流速增大比例较小。     

Thermal analysis of a multi-chip package design

Two-dimensional finite difference computer simulations were used for thermal analysis of an advanced multi-chip package design. In order to model high performance VLSI and ULSI applications, power dissipations ranging from 10 to 40 W/cm² on each chip and zero to 5 W/cm² on the substrate were simulated. It was found that heating due to resistive losses in the thin film interconnections between chips can impact package thermal performance. The calculated device-to-water thermal resistance was 0.4° C/W and the worst case chip-to-chip temperature variation was less than 22° C. This excellent thermal performance illustrates the effectiveness of the package’s water cooled heat sink with direct backside contact to each die. Methods to improve thermal performance are discussed.     

The development of effective model for thermal conduction analysis for 2.5D packaging using TSV interposer

The effective model for the orthotropic TSV (Through Silicon Via) interposer in heat conduction for 2.5D IC integration was proposed in this study. The simple parallel model was used in out-of-plane direction to predict the effective thermal conductivity for the TSV interposer. The in-plane effective thermal conductivity for the interposer was derived on basis of heat balances. By introducing the effective orthotropic thermal parameters, the TSV structures can be ignored in the present effective model. The computations using the effective model for TSV interposer and the 2.5D package with interposer were carried out. The results showed that the accuracy of the effective model was above 95% comparing with the real model including TSV structures when the volume ratio of the electroplating copper and the silicon interposer is smaller than 10%. Using the effective model, the parametric studies on the interposer sizes and the thermal conductivities of different materials in the 2.5D package were conducted with higher efficiency. The results showed that the performance and sizes of EMC (Epoxy Molding Compound) and the package substrate are more important than that of internal underfills in heat dissipation of the package with TSV interposer.     

倒装焊器件封装结构设计

倒装焊是今后高集成度半导体的主要发展方向之一。倒装焊器件封装结构主要由外壳、芯片、引脚(焊球、焊柱、针)、盖板(气密性封装)或散热片(非气密性封装)等组成。文章分别介绍外壳材料、倒装焊区、频率、气密性、功率等方面对倒装焊封装结构的影响。低温共烧陶瓷(LTCC)适合于高频、大面积的倒装焊芯片。大功率倒装焊散热结构主要跟功率、导热界面材料、散热材料及气密性等有关系。倒装焊器件气密性封装主要有平行缝焊或低温合金熔封工艺。     

Thermal characteristics and fabrication of silicon sub-mount based LED package

In this paper, the cost of a light emitting diode (LED) package is lowered by using a silicon substrate as the base attached to the chip, in contrast to the conventional chip-on-board (COB) package. In addition we proposed an LED package with a new structure to promote reliability and lifespan by maximizing heat dissipation from the chip. We designed an LED package combining the advantages of COB based on conventional metal printed circuit board (PCB) and the merits of a silicon sub-mount as a substrate. When an input current 500–1000 mA was applied, the fabricated LED exhibited the light output of approximately 112 lm/W at 29 W. We also measured and compared the thermal resistance of the sub-mount package and conventional COB package. The measured thermal resistance of the sub-mount package with a reflective film of Ag and the COB package were 0.625 K/W and 1.352 K/W, respectively.     

陶瓷复合FR4结构界面形貌与导热性能

基于热电分离式设计理念,将AlN陶瓷片金属化后作为微散热器嵌入FR4材料内形成了复合散热基板.采用电镜扫描、光学显微,通过冷热循环冲击试验对FR4与AlN两相界面处在高低温突变情况下的界面形貌进行了分析.利用ANSYS软件对基板进行了仿真热模拟,研究了AlN嵌入后FR4导热性能的变化规律.利用结温测试仪、功率计和半导体制冷温控台等仪器设备,通过结温测试对比研究了该复合散热结构与金属芯印刷电路板(MCPCB)对大功率LED封装散热效果的影响.结果表明,该复合散热基板在经低温-55℃,高温125℃,1 000个冷热循环后,FR4和AlN界面无剥离现象发生,在环境温度急剧变化的条件下结合力良好.同时,FR4在嵌入AlN之后,导热性能得到了明显改善,且与MCPCB相比,能更有效降低LED芯片结温.