A quad CMOS single-supply op amp with rail-to-rail output swing

The realization of a commercially viable, general-purpose quad CMOS amplifier is presented, along with discussions of the tradeoffs involved in such a design. The amplifier features an output swing that extends to either supply rail, together with an input common-mode range that includes ground. The device is especially well suited for single-supply operation and is fully specified for operation from 5 to 15 V over a temperature range of -55 to +125/spl deg/C. In the areas of input offset voltage, offset voltage drift, input noise voltage, voltage gain, and load driving capability, this implementation offers performance that equals or exceeds that of popular general-purpose quads or bipolar of Bi-FET construction. On a 5-V supply the typical V/SUB os/ is 1 Mv, V/SUB os/ drift is 1.3 /spl mu/V//spl deg/C, 1-kHz noise is 36 nV//spl radic/Hz, and gain is one million into a 600-/spl Omega/ load. This device achieves its performance through circuit design and layout techniques as opposed to special analog CMOS processing, thus lending itself to use on system chips built with digital CMOS technology.     

A CMOS chopper amplifier

A highly sensitive CMOS chopper amplifier for low-frequency applications is described. It is realized with a second-order low-pass selective amplifier using a continuous-time filtering technique. The circuit has been integrated in a 3-/spl mu/m p-well CMOS technology. The chopper amplifier DC grain is 38 dB with a 200-Hz bandwidth. The equivalent input noise is 63 nV//spl radic/Hz and free from 1/f noise. The input offset is below 5 /spl mu/V for a tuning error less than 1%. The amplifier consumes only 34 /spl mu/W.     

A CMOS voltage reference based on weighted /spl Delta/V/sub GS/ for CMOS low-dropout linear regulators

A CMOS voltage reference, which is based on the weighted difference of the gate-source voltages of an NMOST and a PMOST operating in saturation region, is presented. The voltage reference is designed for CMOS low-dropout linear regulators and has been implemented in a standard 0.6-/spl mu/m CMOS technology (V/sub thn//spl ap/|V/sub thp/|/spl ap/0.9 V at 0/spl deg/C). The occupied chip area is 0.055 mm/sup 2/. The minimum supply voltage is 1.4 V, and the maximum supply current is 9.7 /spl mu/A. A typical mean uncalibrated temperature coefficient of 36.9 ppm//spl deg/C is achieved, and the typical mean line regulation is /spl plusmn/0.083%/V. The power-supply rejection ratio without any filtering capacitor at 100 Hz and 10 MHz are -47 and -20 dB, respectively. Moreover, the measured noise density with a 100-nF filtering capacitor at 100 Hz is 152 nV//spl radic/(Hz) and that at 100 kHz is 1.6 nV//spl radic/(Hz).     

An inductance enhancement technique and its application to a shunt-peaked 2.5 Gb/s transimpedance amplifier design

This brief presents a bandwidth enhancement technique that is applicable to gigahertz-range broadband circuits. Using the inductance enhancement technique proposed in this brief, a 2.5-Gb/s transimpedance amplifier (TIA) has been implemented based on a 0.35-/spl mu/m CMOS technology. With the input noise reduction, the TIA with the proposed active inductor loads improves the overall system performances including more that 90% increase in bandwidth. Measurements show the bandwidth of 1.73 GHz, transimpedance gain of 68 dB/spl Omega/, and the averaged input referred noise current of 3.3 pA//spl radic/Hz, respectively, while dissipating 50 mW of dc power.     

Cryogenic capacitive transimpedance amplifier for astronomical infrared detectors

We have developed a new capacitive transimpedance amplifier (CTIA) that can be operated at 2 K, and have good performance as readout circuits of astronomical far-infrared array detectors. The circuit design of the present CTIA consists of silicon p-MOSFETs and other passive elements. The process is a standard Bi-CMOS process with 0.5 /spl mu/m design rule. The open-loop gain of the CTIA is more than 300, resulting in good integration performance. The output voltage swing of the CTIA was 270 mV. The power consumption for each CTIA is less than 10 /spl mu/W. The noise at the output showed a 1/f noise spectrum of 4 /spl mu/V//spl radic/Hz at 1 Hz. The performance of this CTIA nearly fulfills the requirements for the far-infrared array detectors onboard ASTRO-F, Japanese infrared astronomical satellite to be launched in 2005.     

Amplifier techniques for combining low noise, precision, and high-speed performance

A monolithic operational amplifier is presented which optimizes voltage noise both in the audio frequency band, and in the low frequency instrumentation range. In addition, the design demonstrates that the requirements for low noise do not necessitate compromising the specifications in other respects. Techniques are set forth for combining low noise with high-speed and precision performance for the first time in a monolithic amplifier. Achieved results are: 3 nV//spl radic/Hz white noise, 80 nV/SUB p-p/ noise from 0.1 to 10 Hz, 17 V//spl mu/s slew rate, 63 MHz gain-bandwidth product, 10 /spl mu/V offset voltage, 0.2 /spl mu/V//spl deg/C drift with temperature, 0.2 /spl mu/V/month drift with time, and a voltage gain of two million.     

1.25-Gb/s regulated cascode CMOS transimpedance amplifier for Gigabit Ethernet applications

A transimpedance amplifier (TIA) has been realized in a 0.6-/spl mu/m digital CMOS technology for Gigabit Ethernet applications. The amplifier exploits the regulated cascode (RGC) configuration as the input stage, thus achieving as large effective input transconductance as that of Si Bipolar or GaAs MESFET. The RGC input configuration isolates the input parasitic capacitance including photodiode capacitance from the bandwidth determination better than common-gate TIA. Test chips were electrically measured on a FR-4 PC board, demonstrating transimpedance gain of 58 dB/spl Omega/ and -3-dB bandwidth of 950 MHz for 0.5-pF photodiode capacitance. Even with 1-pF photodiode capacitance, the measured bandwidth exhibits only 90-MHz difference, confirming the mechanism of the RGC configuration. In addition, the noise measurements show average noise current spectral density of 6.3 pA//spl radic/(Hz) and sensitivity of -20-dBm for a bit-error rate of 10/sup -12/. The chip core dissipates 85 mW from a single 5-V supply.     

A low-noise high-precision operational amplifier

A low-noise high-precision operational amplifier has recently been fabricated in monolithic form with dielectric isolation. The amplifier exhibits a V/SUB OS/ of 10 /spl mu/V, V/SUB OS/T/SUB c/ of 0.3 /spl mu/V//spl deg/C, voltage gain of 140 dB with a 600 /spl Omega/ load, and an input noise voltage of 9 nV//spl radic/Hz. The settling time to within 0.01 percent of final value is 15 /spl mu/s for a 10 V pulse.     

Design of a low-noise preamplifier for nerve cuff electrode recording

This paper discusses certain important issues involved in the design of a nerve signal preamplifier for implantable neuroprostheses. Since the electroneurogram signal measured from cuff electrodes is typically on the order of 1 /spl mu/V, a very low-noise interface is essential. We present the argument for the use of BiCMOS technology in this application and then describe the design and evaluation of a complete preamplifier fabricated in a 0.8-/spl mu/m double-metal double-poly process. The preamplifier has a nominal voltage gain of 100, a bandwidth of 15 kHz, and a measured equivalent input-referred noise voltage spectral density of 3.3 nV//spl radic/Hz at 1 kHz. The total input-referred rms noise voltage in a bandwidth 1 Hz-10 kHz is 290 nV, the power consumption is 1.3 mW from /spl plusmn/2.5-V power supplies, and the active area is 0.3 mm/sup 2/.     

CMOS wideband amplifiers using multiple inductive-series peaking technique

This work presents the technique of multiple inductive-series peaking to mitigate the deteriorated parasitic capacitance in CMOS technology. Employing multiple inductive-series peaking technique, a 10-Gb/s optical transimpedance amplifier (TIA) has been implemented in a 0.18-/spl mu/m CMOS process. The 10-Gb/s optical CMOS TIA, which accommodates a PD capacitor of 250 fF, achieves the gain of 61 dB/spl Omega/ and 3-dB frequency of 7.2 GHz. The noise measurement shows the average noise current of 8.2 pA//spl radic/Hz with power consumption of 70 mW.     

High-gain differential CMOS transimpedance amplifier with on-chip buried double junction photodiode

An integrated fully differential CMOS transimpedance amplifier (TIA) with buried double junction photodiode input is described. The TIA features a variable high transimpedance gain (250 k/spl Omega/ to 2.5 M/spl Omega/), large DC photocurrent rejection capability (>55 dB) and low input referred noise density at 100 kHz (2pA//spl radic/Hz).     

Design and anaylsis of a 2.5-Gbps optical receiver analog front-end in a 0.35-/spl mu/m digital CMOS technology

This paper presents the design of an optical receiver analog front-end circuit capable of operating at 2.5 Gbit/s. Fabricated in a low-cost 0.35-/spl mu/m digital CMOS process, this integrated circuit integrates both transimpedance amplifier and post limiting amplifier on a single chip. In order to facilitate high-speed operations in a low-cost CMOS technology, the receiver front-end has been designed utilizing several enhanced bandwidth techniques, including inductive peaking and current injection. Moreover, a power optimization methodology for a multistage wide band amplifier has been proposed. The measured input-referred noise of the optical receiver is about 0.8 /spl mu/A/sub rms/. The input sensitivity of the receiver front-end is 16 /spl mu/A for 2.5-Gbps operation with bit-error rate less than 10/sup -12/, and the output swing is about 250 mV (single-ended). The front-end circuit drains a total current of 33 mA from a 3-V supply. Chip size is 1650 /spl mu/m/spl times/1500 /spl mu/m.     

A new integrated front-end for a noninvasive brain imaging system based on near-infrared spectroreflectometry

In this paper, we present a fully integrated front-end of a portable spectroreflectometry-based brain imaging system dedicated for acquisition of modulated optical signals at a frequency of 1 Hz to 25 kHz. The proposed front-end preamplifier is composed of a photodetector, a transimpedance preamplifier, a two-stage voltage amplifier and a mixer. Strict constraints regarding noise thus have to be considered. The preamplifier consists of a transimpedance block featuring a 95-dB/spl Omega/ gain and an average input current noise density at the frequency of interest of approximately 3 pA//spl radic/Hz. Each of the two subsequent voltage amplifiers allows the user to obtain an additional 25-dB gain. Considering the tuning capabilities and the losses due to the filters and the nonideal buffers, the proposed front-end allows us to obtain a total gain up to 145 dB. The back-end of the amplification chain is composed of a mixer which is used to produce a continuous voltage proportional to the amplitude of the input optical signals. All those features were integrated using CMOS 0.18-/spl mu/m technology and the experimental results are in agreement with the initial design requirements.     

An InGaAs-InP HBT differential transimpedance amplifier with 47-GHz bandwidth

Return-to-zero differential phase-shift keying applications require a differential amplifier with high bandwidth, high gain, low noise, and good input impedance match. In this paper, we describe an InGaAs-InP heterostructure bipolar transistor differential transimpedance amplifier with high bandwidth of 47 GHz and high gain of 56 dB-/spl Omega/. The input-referred current noise is less than 35 pA//spl radic/Hz over the measurement range up to 40 GHz.     

A 1.8-V 10-Gb/s fully integrated CMOS optical receiver analog front-end

A fully integrated 10-Gb/s optical receiver analog front-end (AFE) design that includes a transimpedance amplifier (TIA) and a limiting amplifier (LA) is demonstrated to require less chip area and is suitable for both low-cost and low-voltage applications. The AFE is fabricated using a 0.18-/spl mu/m CMOS technology. The tiny photo current received by the receiver AFE is amplified to a differential voltage swing of 400 mV/sub (pp)/. In order to avoid off-chip noise interference, the TIA and LA are dc-coupled on the chip instead of ac-coupled though a large external capacitor. The receiver front-end provides a conversion gain of up to 87 dB/spl Omega/ and -3dB bandwidth of 7.6 GHz. The measured sensitivity of the optical receiver is -12dBm at a bit-error rate of 10/sup -12/ with a 2/sup 31/-1 pseudorandom test pattern. Three-dimensional symmetric transformers are utilized in the AFE design for bandwidth enhancement. Operating under a 1.8-V supply, the power dissipation is 210 mW, and the chip size is 1028 /spl mu/m/spl times/1796 /spl mu/m.     

A capacitor-free CMOS low-dropout regulator with damping-factor-control frequency compensation

A 1.5-V 100-mA capacitor-free CMOS low-dropout regulator (LDO) for system-on-chip applications to reduce board space and external pins is presented. By utilizing damping-factor-control frequency compensation on the advanced LDO structure, the proposed LDO provides high stability, as well as fast line and load transient responses, even in capacitor-free operation. The proposed LDO has been implemented in a commercial 0.6-/spl mu/m CMOS technology, and the active chip area is 568 /spl mu/m/spl times/541 /spl mu/m. The total error of the output voltage due to line and load variations is less than /spl plusmn/0.25%, and the temperature coefficient is 38 ppm//spl deg/C. Moreover, the output voltage can recover within 2 /spl mu/s for full load-current changes. The power-supply rejection ratio at 1 MHz is -30 dB, and the output noise spectral densities at 100 Hz and 100 kHz are 1.8 and 0.38 /spl mu/V//spl radic/Hz, respectively.     

A low-noise low-offset capacitive sensing amplifier for a 50-/spl mu/g//spl radic/Hz monolithic CMOS MEMS accelerometer

This paper describes a CMOS capacitive sensing amplifier for a monolithic MEMS accelerometer fabricated by post-CMOS surface micromachining. This chopper stabilized amplifier employs capacitance matching with optimal transistor sizing to minimize sensor noise floor. Offsets due to sensor and circuit are reduced by ac offset calibration and dc offset cancellation based on a differential difference amplifier (DDA). Low-duty-cycle periodic reset is used to establish robust dc bias at the sensing electrodes with low noise. This work shows that continuous-time voltage sensing can achieve lower noise than switched-capacitor charge integration for sensing ultra-small capacitance changes. A prototype accelerometer integrated with this circuit achieves 50-/spl mu/g//spl radic/Hz acceleration noise floor and 0.02-aF//spl radic/Hz capacitance noise floor while chopped at 1 MHz.     

An NMOS comparator for a bubble memory

A low-noise low-offset comparator was designed for a bubble memory system. The measured noise performance was 25 /spl mu/V rms or 13 nV//spl radic/Hz and the worst case offset voltage was determined to be 158 /spl mu/V. This results in a 1.30 mV comparator gray region.     

应用于10Gb/s光接收机的全差分CMOS跨阻前置电路设计

设计了一种的低成本、低功耗的10 Gb/s光接收机全差跨阻前置放大电路。该电路由跨阻放大器、限幅放大器和输出缓冲电路组成,其可将微弱的光电流信号转换为摆幅为400 mVpp的差分电压信号。该全差分前置放大电路采用0.18 m CMOS工艺进行设计,当光电二极管电容为250 fF时,该光接收机前置放大电路的跨阻增益为92 dB,-3 dB带宽为7.9 GHz,平均等效输入噪声电流谱密度约为23 pA/(0~8 GHz)。该电路采用电源电压为1.8 V时,跨阻放大器功耗为28 mW,限幅放大器功耗为80 mW,输出缓冲器功耗为40 mW,其芯片面积为800 m1 700 m。     

Robust highly linear high-frequency CMOS OTA with IM3 below - 70 dB at 26 MHz

An enhanced configuration for a linearized MOS operational transconductance amplifier (OTA) is proposed. The proposed fully differential OTA circuit is based on resistive source degeneration and an improved adaptive biasing technique. It is robust to process variation, which has not been fully shown in previously reported linearization techniques. Detailed harmonic distortion analysis demonstrating the robustness of the proposed OTA is introduced. The transconductance gain is tunable from 160 to 340 /spl mu/S with a third-order intermodulation (IM3) below -70 dB at 26 MHz. As an application, a 26-MHz second-order low-pass filter fabricated in TSMC 0.35-/spl mu/m CMOS technology with a power supply of 3.3 V is presented. The measured IM3 with an input voltage of 1.4 Vpp is below - 65 dB for the entire filter pass-band, and the input referred noise density is 156nV//spl radic/Hz. The cutoff frequency of the filter is tunable in the range of 13-26 MHz. Theoretical and experimental results are in good agreement.