CMOS电路X射线辐射剂量增强效应

研究了ＣＭＯＳ电路在Ｘ射线辐射环境下性能的退化及剂量增强效应，测量了相对剂量增强系数，对不同工艺ＣＭＯＳ电路的剂量增强系数进行了比较，并对高原子序数材料的Ｘ射线剂量增强机理进行了讨论。     

低能γ光子及X射线在透射金属箱方向激发的次级X射线

采用Ｓｉ（Ｌｉ）Ｘ射线探测系统，以透射法测量了２４１Ａｍ和２３８Ｐｕ放射源的低能γ光子和Ｘ射线在透过不同厚度的Ｆｅ和Ｃｕ箔时激发的次级Ｘ射线相对强度的变化。实验结果表明：激发产生的Ｘ射线相对强度在实验样品厚度范围内随箔厚的增加而增加；在高原子序数材料中将产生更多的特征Ｘ射线；各次级Ｘ射线的强度与箔厚形成方式以及激发源的活度、能量有关。最后对实验结果的物理机制进行了初步探讨。     

低能γ光子及射线在透射金属箔方向激发的次级X射线

采用Ｓｉ（Ｌｉ）Ｘ射线探测系统，以透射法测量了＾２４１Ａｍ和＾２３８Ｐｕ放射源的低能γ光子和Ｘ射线在透过不同厚度的Ｆｅ和Ｃｕ箔时激发的次级Ｘ射线相对强度的变化，实验结果表明，激发产生的Ｘ射线相对强度在实验样品厚度范围内随箔厚的增加而增加，在高原子序数材料中将产生更多的特征Ｘ射线，各次级Ｘ射线的强度与箔厚形成方式以及激发源的活度，能量有关，最后对实验结果的物理机制进行了初步探讨。     

CMOS运算放大器在不同辐射环境下的辐照响应

介绍了ＬＦ７６５０ ＣＭＯＳ运算放大器在＾６０Ｃｏγ射线,１ＭｅＶ电子了４,７,３０ＭｅＶ不同能量质子辐照环境中的响应规律及＾６０Ｃｏγ射线和１ＭｅＶ电子辐照损伤在室温和１００℃高温条件下的退火特性,探讨了引起ＣＭＯＳ运放在不同辐射环境中辐照响应出现差异的损伤机理,并对ＣＭＯＳ运放电路在不同辐射环境中表现出的与ＣＭＯＳ数字电路不同的响应特征给予了解释。     

同步辐射低能X射线的照射量测量与剂量计算

用自制自由空气电离室，在能量为２－１２ｋｅＶ同步辐射光束线现场测量了单能Ｘ射线的电离量，依据Ｘ射线在空气中的传输和衰减特性及能量转移系数，计算了电离室入射口的照射剂量值。进而求出在空气中的相应比释动能和光子通量。讨论了软Ｘ射线照射量随能量的分布特性及混合能量Ｘ射线的照射量测量方法。     

电子束在MOS结构中的能量沉积与辐照效应

根据电子输运“双群理论”计算出电子在Ｓｉ－ＳｉＯ２材料中的能量沉积。用与硅等２效的外推电离室测定了１．０ＭｅＶ和１．５ＭｅＶ的电子束在ＭＯＳ电容芯片中的吸收剂量。用Ｘ光电子谱、俄歇谱、深能级瞬态谱和Ｃ－Ｖ方法测量分析了ＭＯＳ电容Ｓｉ－ＳｉＯ２材料化学结构，界面态密度和Ｃ－Ｖ曲线在辐射前后的变化，根据理论和实验结果，从辐射剂量学的角度分析讨论了电子能量沉积，电离缺陷和辐射效应间的关系，并提出一个关于     

硫对注入YSZ单晶的金属铂在退火过程中结晶的影响

秀卢瑟福背散射－沟道技术（ＲＢＳ－Ｃ）和Ｘ射线衍射技术（ＸＲＤ）研究了Ｐｔ和注入ＹＳＺ（Ｙ２Ｏ３稳定的ＺｒＯ２）后产生的损伤和退火过程中损伤的恢复及注入Ｐｔ的晶化，ＲＢＳ－Ｃ分析表明ＹＳＺ室温下的存在较强自退火效应，ＸＲＤ分析结果示出硫以铂的晶化产生很大影响。     

细胞样品的高分辨率软X射线接触显微术图像的研究

在建立适于软Ｘ射线接触显微术（ＳＸＣＭ）观察细胞样品制备方法的基础上，以培养的肿瘤细胞为生物样品，应用细聚焦软Ｘ射线光源进行ＳＸＣＭ研究，获得了分辨率优于２８ｎｍ的高质量肿瘤细胞ＳＸＣＭ图像。     

^75Se和^113Sn的KX射线发射几率测量

用＾５４Ｍｎ、＾５７Ｃｏ、＾６５Ｚｎ、＾８５Ｓｒ、＾１０９Ｃｄ、＾１３７Ｃｓ等核素发射的ＫＸ射线和Ｉ（ＫＸ）／Ｉ（γ）比值法在５￣４０ｋｅＶ范围内对Ｓｉ（Ｌｉ）探测器的效率进行了刻度（不确定度小于２％）。在此基础上，用Ｓｉ（Ｌｉ）Ｘ射线谱仪系统和ＨＰＧｅγ射线谱仪系统对核素＾７５Ｓｅ和＾１１３Ｓｎ的主γ射线和ＫＸ射线进行了测量，获得了＾７５Ｓｅ和＾１１３Ｓｎ的ＫＸ射线发射几率，并与文献报道值进行了     

CO对金属铀表面氧化层影响研究

用Ｘ射线光电子能谱（ＸＰＳ）和气相色谱（ＧＣ）分析研究了ＣＯ对金属铀表面氧化层的影响。ＣＯ在表面氧化层上的吸附反应导致了Ｕ４ｆ峰向低结合能方向位移，氧化物中氧含量减少，原子比（Ｏ／Ｕ）比值下降了７．２％。体系中ＣＯ２体积分数增大１１．０％。研究结果表明，ＣＯ气氛可抑制金属铀表面的进一步氧化。     

Determination of L3 subshell X-ray production cross-sections and fluorescence yields of Pb, Th and U

A study of L₃ subshell X-ray production cross-sections and fluorescence yields by using characteristic K X-rays as the exciting radiation is described. Only the L₃ subshells of Pb, Th and U were excited by the characteristic K X-rays of the elements used as secondary sources. The cross-sections for the production of L_l, L and L_β groups of L₃ subshell X-rays of Pb, Th and U have been measured using photoionization by Rb, Nb and Mo K X-rays. The measured L₃ X-ray production cross-section values for Pb, Th and U are in good agreement with the theoretical ones evaluated using L₃ subshell fluorescence yield ω₃, fractions of the radiative width F_3i and L₃ subshell photoionization cross-section σ₃. The L₃ subshell fluorescence yields (ω₃) have also been computed using the presently measured cross-section values and the theoretical L₃ subshell photoionization cross-section values. These results are compared with the theoretically predicted values.     

An important mechanism of crop breeding with ultralow energy ion implantation

The characteristic X-rays excited in carbon compounds of seeds by ultralow energy (110 keV) ions implanted in wheat seeds were simulated with carbon-light of synchrotron-radiation. After the seeds were irradiated with the C-light, the through-germination survival fraction of the seeds and the micronucleus frequency in their root-tip cells could be measured. The data verify that the characteristic X-rays excited by the ultralow energy ions implanted in the seeds provide an important mechanism of crop breeding.     

超薄窗Si（Li）探测器在实验中的应用

用超薄窗Ｓｉ（Ｌｉ）探测器测量低能Ｘ射线，将传统的ＰＩＸＥ谱测量范围推广到如Ｓｉ、Ａｌ、Ｎａ等低原子序数元素。还对超薄窗Ｓｉ（Ｌｉ）探测器的具体应用作了描述。     

Photon energy absorption parameters for composite mixtures with boron compounds

Boron compounds that are used in the manufacturing of a variety of products are introduced to the environment in the form of waste. The radiation shielding measurements of mixtures that contain boron compounds is considered to be a topic of concern. The mass attenuation coefficients of (PbO and K₂B₄O₇⋅4H₂O) and (PbO and H₃BO₃) as functions of their changing contents have been measured in the X-ray energy range from 25.191 to 57.903 keV. These values are used to determine the effective atomic number of mixtures. The γ-rays emitted from an Am²⁴¹ annular source have been sent to secondary sources whose characteristic X-rays have been used for transmission arrangement. The characteristic X-rays of the secondary sources have been counted by a Si(Li) detector with a resolution of 149 eV at 5.9 keV. Also, the total effective atomic number of each mixture was determined by using the mixture rule. The measured values were compared with theoretically calculated values.     

Development of Soft X-Ray Sources with Electron Guns of Field Emission- and Thermal Cathode-Types and Their Application to Counter Experiments

Soft X-ray sources have been developed with electron guns of field emission- and thermal cathode-types. Those sources are used mainly to investigate the electron drift and avalanche properties in a gas counter. Thin films of aluminum, titanium, iron, copper and nickel are used as the X-ray targets. Beams of quasi-monochromatic X-rays are obtained with these targets. The emitted X-rays consist of characteristic and bremsstrahlung radiations, which are checked by using a high purity germanium detector. Generation of pulsed X-rays is also tried. As an example of the application of the X-ray source, results of measurements of the SQS (Self Quenching Streamer) phenomenon in a gas counter have been shown.     

特征X射线能谱法测定Fe^＋注入小麦种子的深度

用１１０ｋｅＶ Ｆｅ＾＋离子束垂直注入小麦种胚后，在扫描电子显微镜上沿种子纵沟剖面，在不同深度上测量Ｆｅ元素被激发出的特征Ｘ射线强度分布，结果表明分布呈指数衰减，与晶体中的热扩散分布相类似，并对此进行了讨论。     

Determination of the detection limit of Ni at the Lund AMS facility by using characteristic projectile X-rays

Accelerator mass spectrometry (AMS) is an ultra-sensitive method for counting atoms, both radionuclides and stable nuclides. When using small tandem accelerators to measure heavy isotopes, interfering isobars are often troublesome. One way to reduce this interference is to combine AMS with the detection of characteristic X-rays of the projectile. After analysis in the AMS system it is possible to identify ions of different atomic number by their characteristic X-rays, by slowing down the ions in a suitable target. In this paper, the detection limit of ⁵⁹Ni at the Lund AMS facility is reported. A method for the chemical extraction of nickel from stainless steel, combined with a purification step to reduce the cobalt content in the sample by several orders of magnitude, is also described.     

Contribution of near-edge processes to attenuation of the characteristic X-rays in elements with 48 ≤ Z ≤ 83

Attenuation of the characteristic K X-rays in the ₄₈Cd, ₅₀Sn, ₅₂Te, ₆₄Gd, ₆₅Tb, ₆₆Dy, ₆₈Er, ₇₄Ta, ₇₅Re, ₇₉Au, ₈₂Pb and ₈₃Bi elements have been measured with especial emphasis for the X-ray energies (E_in) in the region of respective K-shell/L_i subshell (i = 1, 2, 3) ionization threshold (B_K/B_Li). The characteristic X-rays were obtained from different fluorescent target elements excited by the X-rays and γ-rays emitted from the ⁵⁵Fe and ²⁴¹Am radioisotopes, respectively. The measurements were performed using an energy-dispersive detection set up involving a low-energy Ge detector. The measured attenuation coefficients for the X-rays with energies away from ionization thresholds of the attenuator element are found to be in good agreement with the available theoretical coefficients, which incorporate contributions of the photoionization, and the Rayleigh and Compton scattering processes. However, the measured attenuation coefficients are found to deviate significantly from the theoretical values for the X-rays with energies in vicinity of B_K/Li. The observed alteration is attributed to the X-ray Absorption Fine Structure (XAFS) for negative B_K/Li − E_in values, and the K-shell/L_i subshell resonant Raman scattering (RRS) process for positive B_K/Li − E_in values. Systematic of the K-shell/L_i subshell RRS contribution to attenuation of the X-rays are discussed in terms of the respective oscillator density and fraction of electrons available in the K-shell/L_i subshell Lorentzian profile of the attenuation element below E_in.     

原位X射线荧光测井井液的影响与校正

本文研究原位X射线荧光测井探测中探测装置与井壁间井液厚度变化对测量结果的影响,通过对测量谱线特征参数的获取提出了一种新的井液校正方法.实验结果表明,这是一种对高含量样品有效、快速、实用的校正方法,校正后目标元素特征X射线峰峰面积与实测没有井液干扰时的峰面积的偏差小于5%.