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排序方式: 共有1322条查询结果,搜索用时 93 毫秒
1.
该工艺技术是在原三联作(TCP+MFE+JET)基础上,根据大港油田勘探试油(测试)的需要,研制开发出的又一新技术,与原三联作相比,一趟管柱不但完成求产、测压、泵排工作,而且还能进行酸化等措施,提高了资料品质,减少了作业成本。经过6井次现场应用,全部达到了设计要求,取得了工艺、资料、成本、速度的较大进步,具有较高推广应用价值。 相似文献
2.
As we approach 100 nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-on-chips. Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. In this paper, we first define a model for integrity faults on the high-speed interconnects. Then, we present a BIST-based test methodology that includes two special cells to detect and measure noise and skew occurring on the interconnects of the gigahertz system-on-chips. Using an inexpensive test architecture the integrity information accumulated by these special cells can be scanned out for final test and reliability analysis. 相似文献
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This paper introduces a new concept of testability called consecutive testability and proposes a design-for-testability method for making a given SoC consecutively testable based on integer linear programming problem. For a consecutively testable SoC, testing can be performed as follows. Test patterns of a core are propagated to the core inputs from test pattern sources (implemented either off-chip or on-chip) consecutively at the speed of system clock. Similarly the test responses are propagated to test response sinks (implemented either off-chip or on-chip) from the core outputs consecutively at the speed of system clock. The propagation of test patterns and responses is achieved by using interconnects and consecutive transparency properties of surrounding cores. All interconnects can be tested in a similar fashion. Therefore, it is possible to test not only logic faults but also timing faults that require consecutive application of test patterns at the speed of system clock since the consecutively testable SoC can achieve consecutive application of any test sequence at the speed of system clock. 相似文献
6.
真空制盐蒸发结晶器的设计与实践 总被引:2,自引:0,他引:2
真空蒸发制盐外热式强制逆循环轴向出料蒸发结晶器,经多个厂家生产应用实践证明是成功的,具有生命力的。这种新型结构,作为一项新技术新设备应加强研究,总结提高,推广应用。不断完善。文章从流体力学、结晶机理角度要求,到具体工程设计参数和材质选用。论述了该罐的特点。 相似文献
7.
N Kayansayan 《International Journal of Refrigeration》1996,19(3):197-207
The paper describes an effectiveness-NTU design method of bayonet-tube evaporators and condensers. Including the effect of the wall superheat on the shell-side film coefficient, and using an energy balance on the tube, differential equations for the steady-state fluid temperatures are formulated. Because of the nonlinear nature of the governing equations, the fourth-order Runge-Kutta method is employed to the solution of the finite difference equations. The results are iterated with the combination of integration techniques. An upper bound to the numerical error being ±5% the fluid temperature distribution as well as the exchanger effectiveness are determined, and presented as a function of the Hurd number, the number of heat transfer units and the flow arrangement. For flow entering through the inner tube, the temperature distribution displays the occurrence of a minimum at a point other than the tube-tip of the exchanger. In an extension of the analysis, an effort is made to illustrate the deviation of the results obtained by uniform film coefficient from the present study, and the differences are outlined. 相似文献
8.
This article presents the HIST approach, which allows the automated insertion of self test hardware into hierarchically designed circuits and systems to implement the RUNBIST instruction of the IEEE 1149.1 standard. To achieve an optimal and throughout self testable system, the inherent design hierarchy is fully exploited. All chips and boards are provided with appropriate test controllers at each hierarchy level. The approach is able to detect all those faults, which are in the scope of the underlying self test algorithms. In this paper the hierarchical test architecture, the test controllers as well as all necessary synthesis procedures are presented. Finally a successful application of the HIST approach to a cryptography processor is described. 相似文献
9.
A system-on-chip (SOC) usually consists of many memory cores with different sizes and functionality, and they typically represent a significant portion of the SOC and therefore dominate its yield. Diagnostics for yield enhancement of the memory cores thus is a very important issue. In this paper we present two data compression techniques that can be used to speed up the transmission of diagnostic data from the embedded RAM built-in self-test (BIST) circuit that has diagnostic support to the external tester. The proposed syndrome-accumulation approach compresses the faulty-cell address and March syndrome to about 28% of the original size on average under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9% for a 1Mb SRAM with 164 faults. A tree-based compression technique for word-oriented memories is also presented. By using a simplified Huffman coding scheme and partitioning each 256-bit Hamming syndrome into fixed-size symbols, the average compression ratio (size of original data to that of compressed data) is about 10, assuming 16-bit symbols. Also, the additional hardware to implement the tree-based compressor is very small. The proposed compression techniques effectively reduce the memory diagnosis time as well as the tester storage requirement. 相似文献
10.
三层架构是数据库开发中最常用的分层架构。三层结构能够提高代码重用率,降低项目开发难度。为了解决手工编写三层架构的代码工作量大且容易出错的问题,使用.Net平台提供的动态编译和反射技术,设计并实现了基于可定制模板的自动代码生成器。该代码生成器利用三层架构的代码依赖数据库的架构信息这一特点,以数据库架构信息、Xml配置文件和模板文件作为输入,输出三层架构的各层代码。用户可以修改Xml配置文件的内容和使用该代码生成器提供的模板语言定制、修改自己的模板文件,方便、灵活地控制输出的目标代码。代码生成器的使用在实际的项目开发中具有重要的意义。 相似文献