基于充放电原理实现的微电容测量电路

具有抗分布电容以及简单实用等特性的充放电电路是目前微电容测量中广泛采用的一种测量电路。本文对基于充放电原理的微电容测量电路进行了深入研究，并介绍一种基于充放电原理的实用电路。     

Effects of modeling means on properties of monitoring models of spot welding quality

Analyzing and modeling the relation between monitoring information during welding and quality information of the joints is the foundation of monitoring resistance spot welding quality. According to the means of modeling, the known models can be divided into three large categories: single linear regression models, multiple linear regression models and multiple non-linear models. By modeling the relations between dynamic resistance information and welding quality parameters with different means, this paper analyzes effects of modeling means on performances of monitoring models of resistance spot welding quality. From the test results, the following conclusions can be drawn: By comparison with two other kinds of models, artificial neural network (ANN) model can describe non-linear and high coupling relationship between monitoring information and quality information more reasonably, improve performance of monitoring model remarkably, and make the estimated values of welding quality parameters more accurate and reliable.     

Measurement of specimen charging in scanning electron microscopy with a kelvin probe

A vibrating Kelvin probe in form of a platinum wire loop is used to measure the surface potential U_s on electron-irradiated free-floating metal and insulator specimens as a function of electron energy E. This allows an accurate measurement of the critical electron energy E₂ for no charging. At energies below E₂, the positive charging increases with decreasing energy to U_s=2–5 eV at E=0.5 keV and switching off the collector bias of the Everhart-Thornley detector. A two-to threefold increase of U_s is observed when the bias is switched on. For E > E₂, the strong increase of a negative surface potential can be measured. Insulating films free-supported on a conductive substrate show a steep decrease to small positive and negative U_s when the film thickness becomes lower than the electron range at a critical energy E₃ > E₂. At insulating specimen the temporal decrease of charging can be measured when the electron beam is switched off.     

激光加热在Al2O3/Ti系梯度功能材料制备过程中的作用及机理

梯度功能材料是一种界面连续化的新型复合材料,本文研究了激光加热在合成Al2O3/Ti系梯度功能材料过程中的作用和机理,同时用激光大光斑加热方法制备出直径11mm厚度3mm完整的FGM试样并加以分析,以及首次采用在试样中埋设微细热电偶成功地测出了激光加热造成的温度梯度分布。     

钢筋网焊机自动生产线的实时控制

在网焊机自动化生产线的研制中,由于点焊控制器、自动上料机构中焊点总数多、驱动路数多、网格间距小、运行速度快,因而对控制系统的实时性提出了较高要求,用工控机与单片机、PLC组成的网焊机控制系统,在软、硬件实现上采取多种方案有机结合,实现了网焊机生产线的高速实时控制。     

基于MATLAB/Simulink的交流伺服系统的仿真

交流伺服系统是一种复杂的非线性时变系统。文中介绍了应用MATLAB/SIMULINK可视化动态仿真平台进行软件伺服的系统仿真方法。该方法采用易扩展的模块化设计,可在线修改和观察所有参数以及参数变化对系统控制效果的影响,从而能方便地验证各种控制策略,并据此选出高效的快速设计方案,缩短了研制周期,对系统设计和调试起到了很大的作用。     

炮孔内空气间隙作用的机理探讨

本文探讨了装药结构中空气间隙作用的机理,提出了气体分子的迁移效应与碰撞效应,比较完满地解释了不同空气间隙对爆破效果的影响.     

交流探尺的控制及其在武钢新3^#高炉上的应用

本文论述了交流探尺的控制原理及到料面信号的检测方法。以其在武钢新３＃高炉上的应用为例，给出系统组态、控制框图及它在无料钟系统中所起的补偿倾动角度的作用。最后对交流、直流探尺系统进行了比较。     

一个全数字化交流永磁伺服系统

介绍了开发的全数字交流伺服系统的组成、基本原理及软、硬件结构。通过与模拟交流伺服系统的比较，说明了全数字交流伺服系统可编程能力强、系统稳定性好、系统性能提高等特点。     

Suitable test structures for submicron ion beam analysis

For the precise determination of the sizes of submicron beam spots test structures with an excellent edge definition are required. For this purpose a semiconductor heterostructure consisting of an 1.62 μm GaInP epi-layer grown on (0 0 1) GaAs has been made, which provides atomically sharp edges for beam spot size measurements. Since the sample has been thinned down by standard transmission electron microscope (TEM) preparation techniques, it can be used for both PIXE and STIM. The sample has been investigated with a TEM and the ion nanoprobe LIPSION. A one-dimensional beam profile in the low current mode was determined by a STIM measurement using 2 MeV protons and yielded a FWHM of (41±4) nm, which is the smallest value reported so far for high energy nuclear micro- and nanoprobes. Furthermore we present nickel nanowhiskers produced at the GSI Darmstadt by electrochemical preparation of etched ion track membranes that have been used to obtain two-dimensional images of the shapes of submicron beam spots. For these measurements a scan over a single nickel nanowhisker having a diameter of 220 nm and a height of about 6 μm was performed.