炮孔内空气间隙作用的机理探讨

本文探讨了装药结构中空气间隙作用的机理,提出了气体分子的迁移效应与碰撞效应,比较完满地解释了不同空气间隙对爆破效果的影响.     

低乙烯含量抗冲聚丙烯的结构表征

采用二甲苯为溶剂，将不同乙烯含量（５％￣１５％质量）的抗冲聚丙烯用特定程序进行分级，将各样品分为室温下可溶于甲苯和不可溶于甲苯的两部分。使用＾１３Ｃ－ＮＭＲ方法和ＦＴ－ＩＲ方法对各组分进行表征，明确了乙烯链段在聚丙烯链上的分布，并在此基础上提出了产生这种链结构的聚合工艺的特点。     

液晶基元直接横挂于主链上的液晶共聚物的合成与研究

以含液晶基元的单体２，５－双（４－甲氧基苯甲酰氧基）苯乙与苯乙烯通过自由基共聚合反应，首次合成了一系列含液晶性和非液晶性两种序列结构的共聚物。采用ＤＳＣ、偏光显微镜和Ｘ衍射方法研究了共聚物的液晶行为，发现单体和共聚物（只有ＣＰ－５和ＣＰ－６）有很好的热致液晶性。随共聚物中介晶单体单元含量的增加，共聚物玻璃化转变温度Ｔ和热分解温度Ｔ呈规律变化。     

双环戊二烯聚合反应热力学和动力学研究

研究了ＤＣＰＤ－ＷＯＣｌ４－ＡｌＥｔ３体系前阶段的反应动力学，采用ＧＣ法分析了不同反应条件下的动力学数据，发现ｌｇ（［ＤＣＰＤ］０／［ＤＣＰＤ］）￣ｔ存在线性关系，说明该体系在前段的聚合反应为一链式反应符合二级反应模型。同时还对该体系聚合反应热力学也进行了研究；对聚合反应的ΔＨｐ、ΔＳｐ、ΔＧｐ进行了讨论。     

A note on stress-constrained truss topology optimization

The purpose of this brief note is to demonstrate that general-purpose optimization methods and codes should not be discarded when dealing with stress-constrained truss topology optimization. By using a disaggregated formulation of the considered problem, such methods may find also “singular optima”, without using perturbation techniques like the ε-relaxed approach. Received February 19, 2002     

Walk－off型光隔离器的隔离度和插入损耗分析

本文介绍了与偏振无关的ｗａｌｋ－ｏｆｆ型光隔离器的原理和结构，从理论和实验两方面分析了影响隔离度和插入损耗的因素，定量计算了加工、调整误差、消光比等对隔离度和插损的限制，给光隔离器的选材、加工和调整提供了依据。     

Finite elements in the analysis of pressure vessels and piping-a bibliography (1976–1996)

The paper gives a bibliographical review of the finite element methods (FEMs) applied for the analysis of pressure vessel structures/components and piping from the theoretical as well as practical points of view. The range of applications of FEMs in this area is wide and cannot be presented in a single paper; therefore the aim of this review is to give the reader an encyclopaedic view of the differnt possibilities that exist today for the finite element analysis in the fields of pressure vessels and piping. The bibliography at the end of the paper contains approximately 1900 references to papers, conference proceedings and theses/dissertations on the subject that were published in 1976–1996. These are classified in the following categories: linear and non-linear, static and dynamic, stress and deflection analysis; stability problems; thermal problems; fracture mechanics problems; contact problems; fluid-structure interaction problems; manufacturing of pipes and tubes; welded pipes and pressure vessel components; development of special finite elements for pressure vessels and pipes; finite element software; and other topics. Also finite element software, general purpose and special purpose codes, used for the analysis of pressure vessels and pipes are briefly discussed and presented.     

Encapsulation of PV modules using ethylene vinyl acetate copolymer as a pottant: A critical review

The primary purpose of this work is to review the literature about what is and is not known about using ethylene vinyl acetate (EVA0 copolymer as the encapsulant (or pottant) material in photovoltaic (PV) modules. Secondary purposes include elucidating the complexity of the encapsulation problem, providing an overview about encapsulation of PV cells and modules, providing a historical overview of the relevant research and development on EVA, summarizing performance losses reported for PV systems deployed since ca. 1981, and summarizing the general problems of polymer stability in a solar environment. We also provide a critical review of aspects of reported work for cases that we believe are important.Failure modes resolved in the early work to establish reliability of deployed modules and the purposes and properties of pottants, are summarized. Typical performance losses in large field-deployed, large-scale systems ranging from 1% to 10% per year are given quantitatively, and qualitative reports of EVA discoloration are summarized with respect to ultraviolet (UV), world-wide location and site dependence.The general stability of polymers and their desirable bulk properties for solar utilization are given. The stabilization formulation for EVA, its effectiveness, and changes in it during degradation are discussed. The degradation mechanisms for the base resin, e.g., unstabilized Elvax 150^TM, and stabilized EVA are indicated for literature dating to the early 1950s, and the role played by unsaturated chromophores is indicated. The limited number of studies relating discoloration and PV cell efficiency are summarized.Observed degradation of EVA or the unstabilized base resin in the laboratory and examples used to measure the degradation are summarized in sections entitled: (1) thermally-induced degradation; (2) photodegradation and photothermal degradation of EVA in different temperature regimes; (3) photobleaching and photodegradation of the UV absorber and cross-linking agent; (4) acetic acid and metal and metal-oxide catalyzed oxidative degradation; and (5) discolaration and PV cell efficiency losses.Processing effects/influences on EVA stability are discussed in sections entitled: (1) EVA raw materials and extruded, uncured films; (2) thermal encapsulation processes; (3) effects of lamination, curing, and curing peroxide on gel content and chromophores formed; and (4) incomplete shielding of curing-generated chromophores. A summary is given for the limited number of accelerated lifetime testing efforts and examples of erroneous service lifetime predictions for EVA are discussed. The known factors that effect the discoloration rate of several EVA formulations are discussed in which the reduction in rate by using UV-absorbing superstrates is a prime example. A summary is given of what is and is not known about EVA degradation mechanisms, degradation from exposures in field-deployed modeules and/or laboratory testing, and factors that contribute to EVA stability or degradation. Finally, conclusions about using Elvax 150 in EVA formulations are summarized, and future prospects for developing the next-generation pottant for encapsulating PV modules are discussed.     

Importance of the choice of the profile model for ap-n junction in the location of deep levels

The energy levels introduced by Pt in silicon have been measured in a non-abruptp ⁺-n junction using constant-capacitance thermal-emission rate measurements and a numerical simulation of high frequency-capacitance. Two levels have been detected with activation energies of:E _c -E _T = 0.22 eV with acceptor character andE _T -E _v = 0.34 eV with donor character. The sample preparation and diffusion of Pt is similar to previous works in which an acceptor levelE _c -E _T = 0.34 eV was found instead of or besides a donorlike levelE _T -E _v = 0.34 eV. Our numerical calculation of the shallow-impurity profile points to the existence of a gradual transition near the metallurgical junction for these samples. We have demonstrated that the well-known model of an abrupt junction is not appropriate for these types of junctions, and could lead to errors in the location attributed to the detected levels. Simulation of the electrical behavior leads to the non-existence of the acceptor levelE _c −E _T = 0.34 eV located in then-side of the junction.