Concentration sensor with multilayer thin film-coupled surface plasmon resonance

A concentration sensor based on silver (Ag)/silica (SiO2)/zirconium anhydride (ZrO2) multilayer structure is proposed. Two dominant dips can be observed in the reflection spectrum, which correspond to different sensing methods. Firstly, it is demonstrated that the coupling between the surface plasmon polariton (SPP) mode and a planar waveguide mode (WGM) leads to the Fano resonance (FR). The induced bonding hybridized modes have ultra-narrow full wave at half maximum (FWHM) as well as ultra-high quality factors (Q). We can achieve a theoretical value of the refractive index sensitivity 167 times higher than conventional surface plasmon resonance (SPR) sensors with a single metal layer. Secondly, the waveguide coupling mode was examined by measuring angular spectra. A deep and sharp waveguide coupling dip was obtained. The experimental results show that with an increase in the concentration of the fill dielectric material in the surface of the system, the resonance dip exhibits a remarkable red shift, and the measured angular sensitivity is 98.04°/RIU.     

基于产品生命周期时间维的冷链工位碳足迹模型与计算

为了计算冷链产品某个工位的碳足迹,针对冷链工位的碳排放,从时间维度出发,定义时间维的冷链碳足迹系统边界,建立基于产品生命周期时间维的冷链碳足迹模型;通过目标分析和数据收集,建立基于统计过程控制方法的碳足迹计算模型,给出单位时间内冷链工位碳足迹量化的准确方法。以某冷链企业为例,计算某批次冷链产品生命周期过程中某工位的碳排放量,并验证了模型的有效性与实用性,从而实现了冷链工位全程碳足迹的分析统计。     

氦离子辐照下钨纳米丝的自保护行为

采用低能量(200 eV)大流强的He⁺辐照多晶钨材料,辐照温度为1023 K和1373 K,辐照剂量为1.0×10²⁵~1.0×10²⁶ ions/m²。用称重、扫描电子显微镜、导电原子力显微镜等手段分析辐照后钨材料的质量损失、表面形貌和内表面缺陷分布,研究了刻蚀速率与表面形貌的关系。结果表明,具有粗糙钨纳米丝表面的钨样品刻蚀速率只有平滑表面的30%。其原因是,在大流强He⁺辐照下钨表面纳米丝的形成阻碍钨原子的溅射。这也意味着,钨纳米丝表面的形成可作为钨材料的自保护结构层,抑制ITER相关辐照下的强刻蚀。