Comprehensive analysis of the influence of structural and dynamic parameters on the accuracy of nano-precision positioning stages

Nano-precision positioning stages are characterized by rigid-flexible coupling systems. The complex dynamic characteristics of mechanical structure of a stage, which are determined by structural and dynamic parameters, exert a serious influence on the accuracy of its motion and measurement. Systematic evaluation of such influence is essential for the design and improvement of stages. A systematic approach to modeling the dynamic accuracy of a nano-precision positioning stage is developed in this work by integrating a multi-rigid-body dynamic model of the mechanical system and measurement system models. The influence of structural and dynamic parameters, including aerostatic bearing configurations, motion plane errors, foundation vibrations, and positions of the acting points of driving forces, on dynamic accuracy is investigated by adopting the H-type configured stage as an example. The approach is programmed and integrated into a software framework that supports the dynamic design of nano-precision positioning stages. The software framework is then applied to the design of a nano-precision positioning stage used in a packaging lithography machine.     

纳米精度在位测量系统测头误差校正方法

针对超精密机床两轴联动接触式在位测量过程中测头误差影响测量精度的问题,提出了一种测头半径误差及形状误差校正方法。进行了在位测量实验,比较分析了测头误差未校正、测头半径误差校正及测头形状误差校正三种情况的测量结果,并分别与Taylor Hobson PGI840离线测量结果进行对比,以验证测头形状误差校正方法的有效性。测头形状误差校正后,面形精度PV值由420nm变为370nm,与离线测量PV值380nm的差值为10nm。结果表明,该在位测量系统测头误差校正方法有效,能够提高在位测量精度。