A pseudo‐differential current‐reuse structure for opamp‐sharing pipelined analog‐to‐digital converters

In this paper, a power efficient pseudo‐differential (PD) current‐reuse structure is presented to alleviate the memory effects of opamp‐sharing in pipelined analog‐to‐digital converters. To implement the PD current‐reuse structure, a switched‐capacitor circuit is introduced for multiplying digital‐to‐analog converter, which has a slight modification compared with the conventional switching scheme with no power penalty. In the proposed multiplying digital‐to‐analog converter circuit, the common‐mode offset amplification of the PD structures is eliminated. Moreover, a PD current‐reuse amplifier is developed from the telescopic structure with an inverter‐based gain‐boosting circuit. The effectiveness of the proposed structure is evaluated in comparison with existing current‐reuse techniques. Copyright © 2014 John Wiley & Sons, Ltd.     

高精度流水线模数转换器的全定制版图设计

采用0.18μm混合信号1P6M CMOS工艺,介绍了一种高精度流水线模数转换器的全定制版图设计。该芯片为数模混合信号IC,工作电压1.8 V/3.3 V,具有12位的采样精度和25 MHz的工作频率。版图设计过程中使用了合适的版图布局和电源、地线网络结构,重点介绍了采样保持模块设计上的一些结构和技巧。芯片测试结果表明芯片功能全部实现、性能良好,版图设计较好地实现了电路功能。     

Design of Pipelined ADC Using Op Amp Sharing Technique

This paper presents a 10-bit 20 MS/s pipelined Analog-to-Digital Converter(ADC)using op amp sharing approach and removing Sample and Hold Amplifier(SHA)or SHA-less technique to reach the goal of low-power consumption.This design was fabricated in TSMC 0.18 μm 1P6M CMOS technology.Measurement results show at supply voltage of 1.8 V,a SFDR of 42.46 dB,a SNDR of 39.45 dB,an ENOB of 6.26,and a THD of 41.82 dB are at 1 MHz sinusoidal signal input.In addition,the DNL and INL are 1.4 LSB and 3.23 LSB respectively.The power consumption is 28.8 mW.The core area is 0.595 mm2 and the chip area including pads is 1.468 mm2.     

一种12位50MS/s CMOS流水线A/D转换器

采用TSMC 0.18μm 1P6M工艺设计了一个12位50 MS/s流水线A/D转换器（ADC）。为了减小失真和降低功耗,该ADC利用余量增益放大电路（MDAC）内建的采样保持功能,去掉了传统的前端采样保持电路;采用时间常数匹配技术,保证输入高频信号时,ADC依然能有较好的线性度;利用数字校正电路降低了ADC对比较器失调的敏感性。使用Cadence Spectre对电路进行仿真。结果表明,输入耐奎斯特频率的信号时,电路SNDR达到72.19 dB,SFDR达到88.23 dB。当输入频率为50 MHz的信号时,SFDR依然有80.51 dB。使用1.8 V电源电压供电,在50 MHz采样率下,ADC功耗为128 mW。     

一个用于12位40-MS/s低功耗流水线ADC的MDAC电路设计

文中设计了一个用于12位40MHz采样率低功耗流水线ADC的MDAC电路.通过对运放的分时复用,使得一个电路模块实现了两级MDAC功能,达到降低整个ADC功耗的目的.通过对MDAC结构的改进,使得该模块可以达到12bit精度的要求.通过优化辅助运放的带宽,使得高增益运放能够快速稳定.本设计在TSMC0.35μmmixsignal3.3V工艺下实现,在40MHz采样频率下,以奈奎斯特采样频率满幅(Vpp=2V)信号输入,其SINAD为73dB,ENOB为11.90bit,SFDR为89dB.整个电路消耗的动态功耗为9mW.     

基于FPGA的高速数据采集系统设计

为了在提高数据采集卡的速度的同时降低成本,设计了一种应用流水线存储技术的数据采集系统。该系统应用软件与硬件相结合的方式来控制实现,通过MAX1308模数转换器完成ADC的转化过程,采用多片Nandflash流水线数据存储模式对高速采集的数据进行存储。搭建硬件电路,并在FPGA内部通过编写VHDL语言实现了采集模块、控制与存储模块和Nandflash存储功能。调试结果表明,芯片的读写时序信号对应的位置准确无误,没有出现时序混乱,且采集速度能保持在10 Mb/s以上。系统实现了低成本、高速多路采集的设计要求。     

A 6.25 Gbps CMOS 10 B/8 B decoder with pipelined architecture

A fully pipelined 10 B/8 B decoder is presented with shorter critical path than before,and so its speed is improved greatly.Based on the proposed architecture,a 10 B/8 B decoder is implemented based on standard cells in 0.18μm CMOS technology with a core area of 375×375μm~2.Measurement results show that the decoder works well and its speed can be up to 6.25 Gbps.At a 1.8 V power supply,the total power consumption is 21.6 mW during 6.25 Gbps operation and the peak-to-peak jitter in the eye diagram is 177.8 ps.     

A stochastic performance model for pipelined Krylov methods

Pipelined Krylov methods seek to ameliorate the latency due to inner products necessary for projection by overlapping it with the computation associated with sparse matrix‐vector multiplication. We clarify a folk theorem that this can only result in a speedup of 2× over the naive implementation. Examining many repeated runs, we show that stochastic noise also contributes to the latency, and we model this using an analytical probability distribution. Our analysis shows that speedups greater than 2× are possible with these algorithms. Copyright © 2016 John Wiley & Sons, Ltd.     

Knowledge-directed inspection for complex multilayered patterns

Combining the knowledge-based processing with image processing is considered a key issue in the future of visual inspection of complex patterns such as multilayered semiconductor wafers. However, present technology restricts this combination, mainly because of the exhaustively long time usually required for each type of processing. To cope with this situation, a unique knowledge-directed image processing method is proposed, in which every image processing step is controlled in real time by parametric knowledge driven by design patterns. The resulting structure of the image processor is a pipeline, in which each piece of knowledge is embodied as a combination of a hardware processing unit and control unit. In this paper the types of knowledge and their implementation are explained, and an inspection machine for logic IC wafers based on this pipelined knowledgedirected image processing is introduced.