| 测量低损耗薄膜材料介电常数的标量法 |
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| 引用本文： | 栾卉,赵凯.测量低损耗薄膜材料介电常数的标量法[J].电波科学学报,2006,21(5):777-781. |
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| 作者姓名： | 栾卉 赵凯 |
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| 作者单位： | 1. 中国科学院东北地理与农业生态研究所,吉林,长春,130012;中国科学院研究生院,北京,100049
2. 中国科学院东北地理与农业生态研究所,吉林,长春,130012 |
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| 基金项目： | 国家高技术研究发展计划(863计划) |
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| 摘 要： | 依据被测介质性质,在现有实验设备条件下,提出了一种标量法测量低损耗薄膜介质介电常数的新方法.该方法利用传输线法测量原理,先测量待测介质损耗,间接得到反射系数,由反射系数与介电常数关系式,推导得出待测介质的介电常数.该方法有样品容易制作,测量简单准确等特点.通过测量实例的误差分析,指出标量法测量薄膜材料介电常数的不足,提出相应的改进措施.
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| 关 键 词： | 低损耗 薄膜材料 介电常数 测量 标量法 |
| 文章编号： | 1005-0388（2006）05-0777-05 |
| 收稿时间： | 2005-04-11 |
| 修稿时间： | 2005年4月11日 |
Measurement of permittivity for low loss film using scalar method |
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| LUAN Hui,ZHAO Kai.Measurement of permittivity for low loss film using scalar method[J].Chinese Journal of Radio Science,2006,21(5):777-781. |
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| Authors: | LUAN Hui ZHAO Kai |
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| Affiliation: | 1. Northeast Institute of Geography And Atzricultural Ecology, Chinese Academy of Sciences, Changchun Jilin 130012, China; 2. Graduate School of Chinese Academy of Sciences, Beijihg 100049, China |
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| Abstract: | A new scalar method of measurement for low loss film medium is presented based on electric properties of measured medium under the present condition of laboratory. By utilizing the principle of transmission measurement, the dielectric loss of medium is firstly measured and reflection coefficient is calculated, then, the medium permittivity is educed by the relationship of reflection coefficient and permittivity. The presented method is of the characteristics of convenient and accurate. Through error analysis of examples, some shortages and improvement plan are discussed in this paper. |
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| Keywords: | low loss thin film permittivity measurement scalar method |
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