| 一种MCU的测试解决方案 |
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| 引用本文： | 陈元,高剑.一种MCU的测试解决方案[J].电子测试,2017(2). |
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| 作者姓名： | 陈元 高剑 |
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| 作者单位： | 集成电路测试技术北京市重点实验室,北京自动测试技术研究所,北京,100088 |
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| 基金项目： | 北京市自然科学基金委员会-北京市科学技术研究院联合资助项目 |
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| 摘 要： | 对MCU进行测试时,如何高效生成测试向量是测试的难点.文章以8位MCU STC12C5410AD为例,详细地介绍了通过使用仿真环境,以C语言编写功能测试程序,完成芯片寄存器控制和主要逻辑单元运算,然后使用集成电路测试系统直接生成测试向量的解决方案.使用此解决方案,可根据测试要求,在较短时间内开发出MCU测试程序,节约测试开发成本.
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| 关 键 词： | 单片机 MCU测试 测试向量 |
MCU Test Solution |
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| Chen Yuan,Gao Jian.MCU Test Solution[J].Electronic Test,2017(2). |
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| Authors: | Chen Yuan Gao Jian |
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| Abstract: | How to quickly and efficiently generate the test pattern is a difficulty for MCU Test. This article introduces a test solution for STC12C5410AD 8-bit MCU, which can also be applied to test MCU with the similar structure. The solution of test is introduced in detail in this paper. C-language is applied in the programming for the control register and main logical operations in simulation environment first, and then the test vectors are generated directly by ATE. By this solution, MCU test program can be developed in a relatively short period of time according to the test requirements. |
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| Keywords: | MCU MCU test test vectors |
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