首页 | 本学科首页   官方微博 | 高级检索  
     

基于微缺陷累计成核数序列的岩石边坡滑移带尺度增长预测
引用本文:王钦亭,王利,毛元春.基于微缺陷累计成核数序列的岩石边坡滑移带尺度增长预测[J].焦作工学院学报,2014(3):363-366.
作者姓名:王钦亭  王利  毛元春
作者单位:河南理工大学土木工程学院,河南焦作454000
基金项目:国家自然科学基金资助项目(41172317).
摘    要:岩石边坡滑移带是一个微损伤聚集带,每一个微损伤实际为一个微缺陷成核,因此,存在累计微缺陷成核数与滑移带尺度增长的对应关系.这个关系以裂纹系统的最大尺度cmax作为未知量,需要确定的参数有材料颗粒尺度δ,微裂纹尺-频分布分维数Dc,裂纹表面粗糙度分维数Ds,微裂纹总数Nd以及微缺陷成核累计数Nd.通过对边坡数值模拟微裂纹系统的统计分析,发现该尺度增长模型的预测值与实测值吻合较好.微缺陷成核数序列与声发射序列有较多的相似性,因此,研究结果为预测边坡内部裂纹增长提供了参考.

关 键 词:边坡  滑移带  微损伤  裂纹尺度  分形

Prediction model of shearing band growth in rock slope based on accumulated microdefects nucleation series
WANG Qin-ting,WANG Li,MAO Yuan-chun.Prediction model of shearing band growth in rock slope based on accumulated microdefects nucleation series[J].Journal of Jiaozuo Institute of Technology(Natural Science),2014(3):363-366.
Authors:WANG Qin-ting  WANG Li  MAO Yuan-chun
Affiliation:(School of Civil Engineering, Henan Polytechnic University, Jiaozuo 454000, Henan, China )
Abstract:The shearing band takes its form from the vast aggregation of microdamage, which is the result of a microdefect nucleation. There must be some certain relation between the accumulated numbers of microdefect nucleation and size growth of the shearing band. In the relation, the maximum crack size in the microcrack system Cmax is taken as a function of a series parameters such as 8, the grain size of the rock, Dc , the grain size of the rock, Ds, the fractal dimension value of the roughness of the crack surface, N(8), the total number of the microcrack with size no less than 8,and N~, the accumulated number of microdefects nucleation. The sta- tistical analysis of a simulated slope shearing band growth shows that the predicted size growth of the shearing band is well conformed to the measured. Because the microdefect nucleation series has some similarities to the acoustic emission(AE) series, it might become a new way to predict the shearing band growth by AE method.
Keywords:slope  shearing band  microdamage  crack size  fractal
本文献已被 CNKI 维普 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号