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| 电感测微仪检定装置的不确定度研究 | |
| 引用本文： | 陈玉芳,杨庆林,张建敏.电感测微仪检定装置的不确定度研究[J].河北工程技术高等专科学校学报,2014(4):31-34. |
| 作者姓名： | 陈玉芳 杨庆林 张建敏 |
| 作者单位： | 1. 河北工程技术高等专科学校,河北沧州,061001 2. 国家知识产权局专利局专利审查协作北京中心,北京,100083 3. 北京工商大学,北京,100037 |
| 摘 要： | 本文建立用二等量块检定电感测微仪的数学模型,详细分析了电感测微仪检定装置的测量不确定度,证明了该电感测微仪检定装置满足电感测微仪检定工作要求。 |
| 关 键 词： | 不确定度 配对法 直接法 |
Research on the Uncertainty of Inductive Micrometer Prover |
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| CHEN Yu-fang,YANG Qing-lin,ZHANG Jian-min.Research on the Uncertainty of Inductive Micrometer Prover[J].Journal of Hebei Engineering and Technical College Quarterly,2014(4):31-34. | |
| Authors: | CHEN Yu-fang YANG Qing-lin ZHANG Jian-min |
| Affiliation: | CHEN Yu-fang, YANG Qing-lin, ZHANG Jian-min (1. Hebei Engineering and Technical College, 061001. Cangzhou, Hebei, China; 2. The Collaboration of the State Intellectual Property Office of Patent Examination Center in Beijing. 100083, Beijing, China; 3. Beijing University of Industry and Commerce, 100037, Beijing. China) |
| Abstract: | This article set up the mathematical model of inductive micrometer with second block gauge verification.It analyzed the measurement uncertainty of inductive micrometer verification device,and proved that the inductive micrometer prover satisfied the requirement of inductive micrometer verification work. |
| Keywords: | uncertainty matching method direct method |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |