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面向弹载计算机的BIT技术研究
引用本文:边 维,邓 凯,王建才,张淑舫.面向弹载计算机的BIT技术研究[J].计算机工程与应用,2018,54(17):231-237.
作者姓名:边 维  邓 凯  王建才  张淑舫
作者单位:1.天津津航计算技术研究所,天津 300308 2.空军驻京津地区军事代表室,天津 300308
摘    要:机内测试(Built-In-Test,BIT)技术是改善系统或设备测试性和维修性的重要途径。在对弹载计算机BIT技术特征进行研究的基础上,提出了弹载计算机BIT设计的基本准则,提供了一种典型的弹载计算机BIT设计方法,经实践验证该设计方法适用于多种类型的弹载计算机设备,故障检测率不低于90%,故障虚警率不超过2%,显著地提高了弹载计算机的可靠性、可测试性及可维护性。

关 键 词:弹载计算机  机内测试  故障检测率  虚警率  

Research on bittechnology on missile-borne computer
BIAN Wei,DENG Kai,WANG Jiancai,ZHANG Shufang.Research on bittechnology on missile-borne computer[J].Computer Engineering and Applications,2018,54(17):231-237.
Authors:BIAN Wei  DENG Kai  WANG Jiancai  ZHANG Shufang
Affiliation:1.Tianjin Jinhang Computing Technology Research Institute, Tianjin 300308, China 2.Military Representative Office of Air Force in Beijing and Tianjin, Tianjin 300308, China
Abstract:BIT technology is an important way to improve the testability and maintainability of system or equipment. Basic principles of missile-borne computer BIT design is proposed which provides a typical method based on feature research of missile-borne computer BIT technology. The practice proves that the design method is applicable to many types of missile-borne computer, and fault detection rate is more than 90%, and then false alarm rate is less than 2%, which significantly improves the reliability, testability and maintainability of missile-borne computer.
Keywords:missile-borne computer  built-in-test  fault detection rate  false alarm rate  
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