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三维表面微观形貌的二维功率谱表征
引用本文:李成贵.三维表面微观形貌的二维功率谱表征[J].计量学报,2004,25(1):11-15.
作者姓名:李成贵
作者单位:北京航空航天大学自动化学院测控系,北京,100083
摘    要:二维谱分析在工程表面的研究中是有效和实用的,在介绍二维快速傅里叶变换基本概念的基础上,推导出了二维功率谱、角谱和半径谱在三维表面形貌中的应用计算方法,并对一些有代表性的精加工表面试件进行了实验研究。结论表明,二维谱分析技术可以表征表面纹理的方向性和不同波长对表面粗糙度高度均方根的影响。

关 键 词:计量学  表面粗糙度  二维功率谱  表面微观形貌  二维FFT
文章编号:1000-1158(2004)01-0011-05
修稿时间:2002年8月15日

Characterization of 3D Surface Micro-topography by 2D Power Spectrum
LI Cheng-gui.Characterization of 3D Surface Micro-topography by 2D Power Spectrum[J].Acta Metrologica Sinica,2004,25(1):11-15.
Authors:LI Cheng-gui
Abstract:The analyses of two-dimensional power spectrums of engineering surfaces are effective and valuable for 3D surface characterization. Based on the two-dimension fast Fourier transform (2D FFT), a detailed procedure to implement the two-dimensional power spectrum, angular spectrum and radial spectrum in three dimensional surfaces is described. In order to have a comprehensive understanding of the spectrum characteristics of engineering surfaces, a spectral atlas of representative fine machining surface are presented and their spectrum properties are discussed. The experiments and analytical results indicate that not only the anisotropy of 3D surface texture, but also the influences of various wavelength on the surface amplitudes can be characterized by two-dimensional power spectrum.
Keywords:Metrology  Surface roughness  2D power spectrum  Surface micro-topography  2D FFT
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