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| LED器件光强分布测试方法进展 | |
| 引用本文： | 孙浩杰,李梦远,庄杰,李柏承,张大伟,杨卫桥.LED器件光强分布测试方法进展[J].光学仪器,2014,36(6):555-560. |
| 作者姓名： | 孙浩杰 李梦远 庄杰 李柏承 张大伟 杨卫桥 |
| 作者单位： | 1. 上海出版印刷高等专科学校,上海,200093 2. 上海理工大学光电信息与计算机工程学院,上海,200093 3. 上海市半导体照明工程技术研究中心,上海,201210 |
| 基金项目： | 上海市半导体照明工程技术研究中心研发专项资助 |
| 摘 要： | 针对LED器件光强分布的测试方法,在传统光源配光曲线的测试原理的基础上,阐述了旋转法、多探测器法测试LED光强分布的方法。由于这些方法存在测试时间长、测量准确度低以及定标繁琐的缺陷,进而介绍了一种新型测试方法及装置,即通过CCD光度探测器接收光强度,经过CCD的光电转换功能将光强度信号转换为电信号,再通过成像系统软件便可得到整个半球面空间内壁的光强图。新的测试方法具有测试速度快、精度高、信息量丰富和直观性的显著优点。 |
| 关 键 词： | 发光二极管(LED) 配光曲线 光强分布 |
| 收稿时间： | 2014/9/11 0:00:00 |
Research on LED light intensity distribution test methods |
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| SUN Haojie,LI Mengyuan,ZHUANG Jie,LI Baicheng,ZHANG Dawei and YANG Weiqiao.Research on LED light intensity distribution test methods[J].Optical Instruments,2014,36(6):555-560. | |
| Authors: | SUN Haojie LI Mengyuan ZHUANG Jie LI Baicheng ZHANG Dawei and YANG Weiqiao |
| Affiliation: | Shanghai Publishing and Printing College, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;Shanghai Semiconductor Lighting Engineering Research Center, Shanghai 201210, China |
| Abstract: | The paper introduced the principles of the light distribution of traditional light sources, and described the method of rotation and multi-detector method for testing LED light intensity distribution. Then, the paper pointed out the defects of them, i.e. long measurement time, low measurement accuracy and calibration complexity. Thereby the paper introduced a novel method. An optical detector receives the light intensity by a CCD, and light intensity is converted to an electrical signal. Then, the software of the system can obtained a light intensity spatial map by imaging the entire inner wall of the hemispherical surface. This method has high test speed, high precision, information-rich and intuitive significant advantages. |
| Keywords: | light-emitting diodes photometry light intensity distribution |
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