A probabilistic method for the design of power grounding systems

An improved multivariable, probabilistic method for the safety analysis of power grounding systems is presented. The application of this method is demonstrated in four examples. The first three examples illustrate the practical evaluation of one new and two existing substation grounding grids when the substation is connected to an overhead distribution system. The fourth example ascertains the relative impact of a difference between the S curve of IEC Publication 479 and Dalziel's equation for the allowable body current used in ANSI/IEEE Std 80-1986 on the validity of an exposure model based on the requirements of Std 80. In this example, the statistical data on ground faults have been taken from actual system records. Further possible refinements of the exposure model are discussed     

Enhanced electron emission from phosphorus-doped diamond-cladsilicon field emitter arrays

Undoped and phosphorus (P)-doped diamond-clad Si field emitter arrays have been successfully fabricated using microwave plasma chemical vapor deposition (MPCVD) technology. The electron emission from the blunt diamond-clad microtips are much higher than those for the pure Si tips with sharp curvature due to a lower work function. Furthermore, the characteristics of emission current against applied voltage for the P-doped diamond-clad tips show superior emission at lower field to the undoped ones. After the examination of Auger electron spectroscopy (AES) and electrical characteristics of as-grown diamond, such a significant enhancement of the electron emission from the P-doped diamond-clad tips is attributed to a higher electron conductivity and defect densities     

Exact evaluation of laser linewidth requirements for optical PSKhomodyne communication systems with balanced PLL receivers

The power penalty induced by imperfect phase recovery in PSK homodyne communication systems with balanced phase-locked loop receivers are exactly evaluated. Optimum phase deviations between the mark-state and the space-state bits are used in this study. This study for the first time shows the imperfect-phase-recovery-induced power penalty as a function of laser linewidth with optimum phase deviations considered. It can be estimated from the theoretical result that an optimal balanced PLL receiver requires the laser linewidth as Δν⩽1.15×10^-6× (bit rate) in contrast to the previous reported one Δν⩽5.88×10^-6× (bit rate). We also point out here that the previously reported laser linewidth requirement was wrongly estimated     

The As-prepared surfaces of C-axis-oriented Nd1Ba2Cu3Oy thin films characterized using scanning probe microscopes

Recently, superconducting Nd₁Ba₂Cu₃O_y (Ndl23) thin films with high superconducting transition temperature (T _c) have been successfully fabricated at our institute employing the standard laser ablation method. In this paper, we report the results of surface characterization of the Nd123 thin films using an ultrahigh vacuum scanning tunneling microscope/spectroscopy (UHV-STM/STS) and an atomic force microscope (AFM) system operated in air. Clear spiral pattern is observed on the surfaces of Nd123 thin films by STM and AFM, suggesting that films are formed by two-dimensional island growth mode. Contour plots of the spirals show that the step heights of the spirals are not always the integer or half-integer number of thec-axis parameter of the structure. This implies that the surface natural termination layer of the films may not be unique. This result is supported byI-V STS measurements. The surface morphology of the Nd123 thin films is compared with that of thec-axis-oriented Y₁Ba₂Cu₃S_y thin films. Surface atomic images of the as-prepared Nd123 thin films are obtained employing both STM and AFM. STS measurements show that most of the surfaces are semiconductive. The results of STS measurements together with the fact that we are able to see the surface atomic images using scanning probe microscopes suggest that exposure to air does not cause serious degradation to the as-prepared surfaces of Nd123 thin films.     

Nutrient removal performance of an anaerobic–anoxic–aerobic process as a function of influent C/P ratio

The laboratory scale anaerobic–anoxic–aerobic (A²O) process fed with synthetic brewage wastewater was designed to investigate the effects of changing feed C/P ratio on the performance of biological nutrient removal (BNR) processes. In the experiment, the influent chemical oxygen demand (COD) concentration was kept at approximately 300 mg L^?1 while the total phosphorus concentration was varied to obtain the desired C/P ratio. Results showed that when the C/P ratio was lower than 32, phosphorus removal efficiency increased as C/P ratio increased linearly, while when the C/P ratio was higher than 32, the P removal efficiency was maintained at 90–98%, and effluent P concentration was lower than 0.5 mg L^?1. However, regardless of the C/P ratio, excellent COD removal (90% or higher) and good total nitrogen removal (75–84%) were maintained throughout the experiments. It was also found that very good linear correlation was obtained between COD uptake per unit P released in the anaerobic zone and C/P ratio. In addition, the P content in the wasted activated sludge increased with the decrease in the C/P ratio. Based on the results, it was recommended that the wastewater C/P ratio and its effects be incorporated into BNR design and operational procedures, appropriate C/P ratios were used to achieve the effluent treatment goals. Copyright © 2005 Society of Chemical Industry     

Modeling Power Supply Noise in Delay Testing

Excessive power supply noise during test can cause overkill. This article discusses two models for supply noise in delay testing and their application to test compaction. The proposed noise models avoid complicated power network analysis, making them much faster than existing power noise analysis tools. can cause performance degradation and     

Seya-Nanioka系统真空紫外单色仪的分辨能力及波长读数精度

本文分析了Seya-Namioka系统光学参数与离焦量的关系,为选取最佳光学参数提供了依据。同时,简要说明了影响谱线质量及波长读数精度的因素,并讨论了补偿波长读数误差的方法。