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51.
Tzong-Lin Wu Hung-Chun Chang 《Lightwave Technology, Journal of》1995,13(9):1926-1934
Based on vectorial formulations which combine the surface integral equation method and the finite-element method, a novel numerical approach is proposed for calculating the dispersion coefficients of dual-mode elliptical-core fibers with arbitrary refractive index profiles. By differentiating the original formulations involving the propagation constant β and the guided mode fields Hx and Hy once and twice with respect to the normalized frequency V, the new formulations for {dβ/dV, dHx/dV, dHy/dV} and for {d2β/dV2, d2 Hx/dV2, d2Hy/dV2 } are obtained respectively. Once {β, Hx, Hy } is solved through the eigenvalue procedure which dominates the computing time, only a few matrix manipulations are required to obtain {dβ/dV, dHx/dV, dHy/dV} and {d2β/dV2, d2Hx/dV2 , d2Hy/dV2}. Some numerical examples are examined to see the influence of different refractive index distributions with dips on the dispersions of the four nondegenerate LP 11 modes for elliptical-core fibers 相似文献
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通过几个典型事例的分析、判断和处理,介绍了该厂怎样利用91l型数采器对2D12—100/8型空压机运行状态进行监测,以预报早期故障,为设备检修提供指导. 相似文献
56.
Bor -Yir Chen Wei -Hsiung Wu Jiann -Ruey Chen Chum -Sam Hong 《Journal of Materials Science》1995,30(9):2254-2256
The temperature dependence characteristics of hydrogenated amorphous silicon thin-film transistors were investigated. The results indicate that as the temperature was increased, the threshold voltage and the field-effect mobility were first increased, and then decreased, which may be controlled by different mechanisms at low and high temperatures. In addition, if the temperature was higher than 420 K, the Fermi level was promoted to the degenerate-like states, the current channel always existed due to the temperature effect, and the threshold voltage became negative. 相似文献
57.
Double-step generation of ellipses 总被引:4,自引:0,他引:4
The principle of double-step incremental generation of nonparametric curves on a discrete plane is used to develop a double-step algorithm for scan converting ellipses in sixteen separate segments. The algorithm iterates only half as many times as current algorithms, while each iteration demands the same number of operations or slightly fewer operations than M. Pitteway's (1967, 1985) algorithm (previously the fastest one). This marked gain in the speed of scan conversion is due to the fact that the middle pixel in a two-step increment is obtained without computation 相似文献
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Lada E.K. Jye-Chyi Lu Wilson J.R. 《Semiconductor Manufacturing, IEEE Transactions on》2002,15(1):79-90
To detect faults in a time-dependent process, we apply a discrete wavelet transform (DWT) to several independently replicated data sets generated by that process. The DWT can capture irregular data patterns such as sharp "jumps" better than the Fourier transform and standard statistical procedures without adding much computational complexity. Our wavelet coefficient selection method effectively balances model parsimony against data reconstruction error. The few selected wavelet coefficients serve as the "reduced-size" data set to facilitate an efficient decision-making method in situations with potentially large-volume data sets. We develop a general procedure to detect process faults based on differences between the reduced-size data sets obtained from the nominal (in-control) process and from a new instance of the target process that must be tested for an out-of-control condition. The distribution of the test statistic is constructed first using normal distribution theory and then with a new resampling procedure called "reversed jackknifing" that does not require any restrictive distributional assumptions. A Monte Carlo study demonstrates the effectiveness of these procedures. Our methods successfully detect process faults for quadrupole mass spectrometry samples collected from a rapid thermal chemical vapor deposition process 相似文献